Structural coupling across the direct EuO/Si interface von Averyanov, Dmitry V, Tokmachev, Andrey M, Likhachev, Igor A, Lobanovich, Eduard F, Parfenov, Oleg E, Pashaev, Elkhan M, Sadofyev, Yuri G, Subbotin, Ilia A, Yakunin, Sergey N, Storchak, Vyacheslav G

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Investigation of the effect of substrate orientation on the structural, electrical and optical properties of n-type GaAs1−xBix layers grown by Molecular Beam Epitaxy von Alhassan, Sultan, de Souza, Daniele, Alhassni, Amra, Almunyif, Amjad, Alotaibi, Saud, Almalki, Abdulaziz, Alhuwayz, Maryam, Kazakov, Igor P., Klekovkin, Alexey V., Tsekhosh, Vladimir I., Likhachev, Igor A., Pashaev, Elkhan.M., Souto, Sergio, Gobato, Yara Galvão, Saqri, Noor Al, Galeti, Helder Vinicius Avanço, Al mashary, Faisal, Albalawi, Hind, Alwadai, Norah, Henini, Mohamed

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Structural and optical properties of n-type and p-type GaAs(1−x)Bi x thin films grown by molecular beam epitaxy on (311)B GaAs substrates von De Souza, Daniele, Alhassan, Sultan, Alotaibi, Saud, Alhassni, Amra, Almunyif, Amjad, Albalawi, Hind, Kazakov, Igor P, Klekovkin, Alexey V, ZinovEv, Sergey A, Likhachev, Igor A, Pashaev, Elkhan M, Souto, Sergio, Galvão Gobato, Yara, Avanço Galeti, Helder Vinicius, Henini, Mohamed

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Microstructure of QD-like clusters in GaAs/In(As,Bi) heterosystems von Likhachev, Igor A., Trunkin, Igor N., Tsekhosh, Vladimir I., Prutskov, Grigory V., Subbotin, Ilia A., Klekovkin, Alexey V., Pashaev, Elkhan M., Vasiliev, Alexander L., Kazakov, Igor P.

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Growth, structural and optical studies of CdSe/ZnSe nanostructures grown by MBE on GaAs and Si substrates von Rzaev, Murvetali M., Kazakov, Igor P., Kozlovski, Vladimir I., Skasyrsky, Yan K., Onishchenko, Evgeny E., Schäffler, Friedrich, Hesser, Gunter, Pashaev, Elkhan M., Soubbotin, Ilia A.

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High-Resolution X-Ray Studies of the Direct Spin Contact of EuO with Silicon von Averyanov, Dmitry V, Tokmachev, Andrey M, Likhachev, Igor A, Lobanovich, Eduard F, Parfenov, Oleg E, Pashaev, Elkhan M, Sadofyev, Yuri G, Subbotin, Ilia A, Yakunin, Sergey N, Storchak, Vyacheslav G

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High-Resolution X-Ray Studies of the Direct Spin Contact of EuO with Silicon von Averyanov, Dmitry V, Tokmachev, Andrey M, Likhachev, Igor A, Lobanovich, Eduard F, Parfenov, Oleg E, Pashaev, Elkhan M, Sadofyev, Yuri G, Subbotin, Ilia A, Yakunin, Sergey N, Storchak, Vyacheslav G

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RADIOGRAPHIC METHOD OF DETECTING DEFECTS IN CRYSTAL STRUCTURES von IMAMOV RAFIK M,SU, PASHAEV ELKHAN M,SU, POLOVINKINA VERA I,SU, AFANASEV ALEKSANDR M,SU

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X-RAY DIFFRACTION METHOD OF ANALYZING STRUCTURE DISARRANGEMENTS IN THIN NEAR-SURFACE LAYERS OF CRYSTALS von ZAVYALOVA ANNA A,SU, IMAMOV RAFIK M,SU, PASHAEV ELKHAN M,SU, FEDYUKIN SERGEJ A,SU, KHASHIMOV FARRUKH R,SU, AFANASEV STANISLAV M,SU, LOMOV ANDREJ A,SU, AFANASEV ALEKSANDR M,SU

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