Application of atomic force microscopy to detect edge of mask contaminations that may hinder titanium silicide formation von Bresolin, C., Pesaturo, M., Paruzzi, P., Soncini, V., Erbetta, D., Bigi, M.

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Double-Poly EEPROM Cell for High Density Memories using Positive and Negative Voltage Programming von Pio, F., Paruzzi, P., Baldi, L., Riva, C.

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Levels in 138Ce by in-beam spectroscopy von Lo Bianco, G., Paruzzi, P., Schmittgen, K.P., Reinhardt, R., Gelberg, A., Zell, K.O., Von Brentano, P., Blasi, N.

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The lifetime of the 266 keV level in 206Tl von Bharuth-Ram, K., Lo Bianco, G., Paruzzi, P., Dewald, A., Wrzesinski, J., Zell, K.O., Von Brentano, P.

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