Science-based MEMS reliability methodology von Tanner, D.M., Parson, T.B., Corwin, A.D., Walraven, J.A., Wittwer, J.W., Boyce, B.L., Winzer, S.R.

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Accelerating aging failures in MEMS devices von Tanner, D.M., Walraven, J.A., Dugger, M.T., Parson, T.B., Candelaria, S.A., Jenkins, M.W., Corwin, A.D., Ohlhausen, J.A., Huffman, E.M.

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Altering FAK-paxillin interactions reduces adhesion, migration and invasion processes von Deramaudt, Thérèse B, Dujardin, Denis, Noulet, Fanny, Martin, Sophie, Vauchelles, Romain, Takeda, Ken, Rondé, Philippe

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