A 110 nm CMOS process for fully-depleted pixel sensors von Pancheri, L., Olave, J., Panati, S., Rivetti, A., Cossio, F., Rolo, M., Demaria, N., Giubilato, P., Pantano, D., Mattiazzo, S.

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The iMPACT project tracker and calorimeter von Mattiazzo, S., Bisello, D., Giubilato, P., Pantano, D., Pozzobon, N., Snoeys, W.

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Total Ionizing Dose effects on a 28 nm Hi-K metal-gate CMOS technology up to 1 Grad von Mattiazzo, S., Bagatin, M., Bisello, D., Gerardin, S., Marchioro, A., Paccagnella, A., Pantano, D., Pezzotta, A., Zhang, C-M., Baschirotto, A.

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Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments von Gonella, L., Faccio, F., Silvestri, M., Gerardin, S., Pantano, D., Re, V., Manghisoni, M., Ratti, L., Ranieri, A.

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SIRAD: an irradiation facility at the LNL Tandem accelerator for radiation damage studies on semiconductor detectors and electronic devices and systems von Wyss, J, Bisello, D, Pantano, D

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LePix—A high resistivity, fully depleted monolithic pixel detector von Giubilato, P., Bisello, D., Chalmet, P., Denes, P., Kloukinas, K., Mattiazzo, S., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Snoeys, W., Tindall, C.

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Advanced proton imaging in computed tomography von Mattiazzo, S, Bisello, D, Giubilato, P, Pantano, D, Pozzobon, N, Snoeys, W, Wyss, J

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80: ProXY – High performance monolithic pixel tracker for proton tomography von Giubilato, P, Bisello, D, Mattiazzo, S, Pantano, D, Pozzobon, N, Snoeys, W, Wyss, J

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Design and characterization of novel monolithic pixel sensors for the ALICE ITS upgrade von Cavicchioli, C., Chalmet, P.L., Giubilato, P., Hillemanns, H., Junique, A., Kugathasan, T., Mager, M., Marin Tobon, C.A., Martinengo, P., Mattiazzo, S., Mugnier, H., Musa, L., Pantano, D., Rousset, J., Reidt, F., Riedler, P., Snoeys, W., Van Hoorne, J.W., Yang, P.

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Monolithic active pixel sensor development for the upgrade of the ALICE inner tracking system von Aglieri, G, Cavicchioli, C, Chalmet, P L, Chanlek, N, Collu, A, Giubilato, P, Hillemanns, H, Junique, A, Keil, M, Kim, D, Kim, J, Kugathasan, T, Lattuca, A, Mager, M, Tobon, C A Marin, Marras, D, Martinengo, P, Mattiazzo, S, Mazza, G, Mugnier, H, Musa, L, Pantano, D, Puggioni, C, Rousset, J, Reidt, F, Riedler, P, Siddhanta, S, Snoeys, W, Usai, G, Hoorne, J W van, Yang, P, Yi, J

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LePIX: First results from a novel monolithic pixel sensor von Mattiazzo, S., Battaglia, M., Bisello, D., Caselle, M., Chalmet, P., Demaria, N., Giubilato, P., Ikemoto, Y., Kloukinas, K., Mansuy, C., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Silvestrin, L., Snoeys, W., Wyss, J.

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Design of a 10-bit segmented current-steering digital-to-analog converter in CMOS 65 nm technology for the bias of new generation readout chips in high radiation environment von Robertis, G. De, Loddo, F., Mattiazzo, S., Pacher, L., Pantano, D., Tamma, C.

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Monolithic pixels on moderate resistivity substrate and sparsifying readout architecture von Giubilato, P., Battaglia, M., Bisello, D., Caselle, M., Chalmet, P., Demaria, L., Ikemoto, Y., Kloukinas, K., Mansuy, S.C., Mattiazzo, S., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Silvestrin, L., Snoeys, W.

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A DAQ system for pixel detectors R&D von Battaglia, M., Bisello, D., Contarato, D., Giubilato, P., Pantano, D., Tessaro, M.

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Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy von Gerardin, S., Bagatin, M., Paccagnella, A., Bisello, D., Giubilato, P., Mattiazzo, S., Pantano, D., Silvestrin, L., Tessaro, M., Wyss, J., Ferlet-Cavrois, V.

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Radiation tolerance of a moderate resistivity substrate in a modern CMOS process von Potenza, A., Bisello, D., Caselle, M., Costa, M., Demaria, N., Giubilato, P., Ikemoto, Y., Mansuy, C., Marchioro, A., Mattiazzo, S., Moll, M., Pacher, L., Pacifico, N., Pantano, D., Rivetti, A., Silvestrin, L., Snoeys, W.

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Investigating Degradation Mechanisms in 130 nm and 90 nm Commercial CMOS Technologies Under Extreme Radiation Conditions von Ratti, L., Gaioni, L., Manghisoni, M., Traversi, G., Pantano, D.

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First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM von Mattiazzo, S., Bisello, D., Giubilato, P., Kaminsky, A., Pantano, D., Silvestrin, L., Tessaro, M., Wyss, J.

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CMOS sensors in 90 nm fabricated on high resistivity wafers: Design concept and irradiation results von Rivetti, A, Battaglia, M, Bisello, D, Caselle, M, Chalmet, P, Costa, M, Demaria, N, Giubilato, P, Ikemoto, Y, Kloukinas, K, Mansuy, C, Marchioro, A, Mugnier, H, Pantano, D, Potenza, A, Rousset, J, Silvestrin, L, Wyss, J

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Low power, high resolution MAPS for particle tracking and imaging von Giubilato, P., Cavicchioli, C., Chalmet, P., Kugathasan, T., Tobon, C. Marin, Mattiazzo, S., Mugnier, H., Pantano, D., Pozzobon, N., Rousset, J., Snoeys, W., Yang, P.

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