Treffer 1 - 3 von 3 für Suche 'Paine, Amelia W.', Suchdauer: 0,23s Treffer weiter einschränken
  1. 1
    Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis

    Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis von de Wit, Xander M., Paine, Amelia W., Martin, Caroline, Goldfain, Aaron M., Garmann, Rees F., Manoharan, Vinothan N.

    Veröffentlicht in Applied optics (2004)

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  2. 2
    Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis

    Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis von de Wit, Xander M, Paine, Amelia W, Martin, Caroline, Goldfain, Aaron M, Garmann, Rees F, Manoharan, Vinothan N

    Veröffentlicht in arXiv.org

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  3. 3
    Data for 'Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis'

    Data for 'Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis' von de Wit, Xander M., Paine, Amelia W., Martin, Caroline, Goldfain, Aaron M., Garmann, Rees F., Manoharan, Vinothan N.

    Volltext bestellen
    Dataset

    Zu den Favoriten
    Gespeichert in:

Suchwerkzeuge: