Inversion domains in AlN grown on (0001) sapphire von Jasinski, J., Liliental-Weber, Z., Paduano, Q. S., Weyburne, D. W.

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Effect of initial process conditions on the structural properties of AlN films von Paduano, Q.S., Weyburne, D.W., Jasinski, J., Liliental-Weber, Z.

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An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials von Paduano, Q.S., Weyburne, D.W., Drehman, A.J.

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Correlation between optoelectronic and structural properties and epilayer thickness of AlN von Pantha, B. N., Dahal, R., Nakarmi, M. L., Nepal, N., Li, J., Lin, J. Y., Jiang, H. X., Paduano, Q. S., Weyburne, David

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Stalled cerebral capillary blood flow in mouse models of essential thrombocythemia and polycythemia vera revealed by in vivo two‐photon imaging von Santisakultarm, T. P., Paduano, C. Q., Stokol, T., Southard, T. L., Nishimura, N., Skoda, R. C., Olbricht, W. L., Schafer, A. I., Silver, R. T., Schaffer, C. B.

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Iodine vapor phase growth of GaN: dependence of epitaxial growth rate on process parameters von Tassev, V, Bliss, D, Suscavage, M, Paduano, Q.S, Wang, S-Q, Bouthillette, L

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X-ray characterization of high quality AlN epitaxial layers: effect of growth condition on layer structural properties von Paduano, Q. S., Drehman, A. J., Weyburne, D. W., Kozlowski, J., Serafinczuk, J., Jasinski, J., Liliental-Weber, Z.

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Determination of Alloy Composition and Residual Stress for AlxGa1-xN/GaN Epitaxial Films von Paduano, Q., Weyburne, D., Wang, S-Q.

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Two-step Process for the Metalorganic Chemical Vapor Deposition Growth of High Quality AlN Films on Sapphire von Paduano, Qing, Weyburne, David

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ENERGY BAND GAP OF AlxGa1-xN von Paduano, Q S, Weyburne, D W, Bouthillette, L O, Wang, S-Q, Alexander, M N

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Correlation between optoelectronic and structural propertiesand epilayer thickness of AlN von Pantha, B. N., Dahal, R., Nakarmi, M. L., Nepal, N., Li, J., Lin, J. Y., Jiang, H. X., Paduano, Q. S., Weyburne, David

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A new method for predicting thermal flow stability: application to a heated rotating disk von Weyburne, David W., Paduano, Qing

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Evaluation and optimization of large area III-V epitaxial thickness uniformity using a Fabry-Perot microcavity test structure von PADUANO, Q. S, WEYBURNE, D, FENG LU, BHAT, R

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Simultaneous determination of the compositions and thicknesses of a multilayer film using spectroreflectometry von Weyburne, David W., Paduano, Qing S.

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Prediction of mutual diffusion coefficients in binary liquid systems with one self-associating component from viscosity data and intra-diffusion coefficients at infinite dilution von Zhu, Q., D'Agostino, C., Ainte, M., Mantle, M.D., Gladden, L.F., Ortona, O., Paduano, L., Ciccarelli, D., Moggridge, G.D.

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Prediction of mutual diffusion coefficients in binary liquid systems with one self-associating component from viscosity data and intra-diffusion coefficients at infinite dilution von Zhu, Q, D'Agostino, C, Ainte, M, Mantle, MD, Gladden, LF, Ortona, O, Paduano, L, Ciccarelli, D, Moggridge, GD

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