Laser-heated diamond anvil cell at the advanced light source beamline 12.2.2 von Caldwell, Wendel A., Kunz, Martin, Celestre, R.S., Domning, E.E., Walter, M.J., Walker, D., Glossinger, J., MacDowell, A.A., Padmore, H.A., Jeanloz, R., Clark, S.M.

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Vortex Core-Driven Magnetization Dynamics von S. -B. Choe, Acremann, Y., Scholl, A., Bauer, A., Doran, A., Stöhr, J., Padmore, H. A.

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Development of a 3-D energy-momentum analyzer for meV-scale energy electrons von Karkare, S., Feng, J., Maxson, J., Padmore, H. A.

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Ultrafast structural changes measured by time-resolved X-ray diffraction von LARSSON, J, HEIMANN, P. A, LINDENBERG, A. M, SCHUCK, P. J, BUCKSBAUM, P. H, LEE, R. W, PADMORE, H. A, WARK, J. S, FALCONE, R. W

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Antiphase resonance at X-ray irradiated microregions in amorphous Fe80B20 stripes von Urdiroz, U., Gómez, A., Magaz, M., Granados, D., Sánchez Agudo, M., Rubio-Zuazo, J., Castro, G.R., Stan, C., Tamura, N., Padmore, H.A., Müller, C., McCord, J., Cebollada, F., Palomares, F.J., González, J.M.

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A low emittance and high efficiency visible light photocathode for high brightness accelerator-based X-ray light sources von Vecchione, T., Ben-Zvi, I., Dowell, D. H., Feng, J., Rao, T., Smedley, J., Wan, W., Padmore, H. A.

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First commissioning results for the elliptically polarizing undulator beamline at the Advanced Light Source von Young, A.T., Feng, J., Arenholz, E., Padmore, H.A., Henderson, T., Marks, S., Hoyer, E., Schlueter, R., Kortright, J.B., Martynov, V., Steier, C., Portmann, G.

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X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films von Phillips, M.A, Spolenak, R, Tamura, N, Brown, W.L, MacDowell, A.A, Celestre, R.S, Padmore, H.A, Batterman, B.W, Arzt, E, Patel, J.R

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A 10,000 groove/mm multilayer coated grating for EUV spectroscopy von Voronov, D L, Anderson, E H, Cambie, R, Cabrini, S, Dhuey, S D, Goray, L I, Gullikson, E M, Salmassi, F, Warwick, T, Yashchuk, V V, Padmore, H A

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Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope von Scholl, A., Marcus, M.A., Doran, A., Nasiatka, J.R., Young, A.T., MacDowell, A.A., Streubel, R., Kent, N., Feng, J., Wan, W., Padmore, H.A.

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Control of surface mobility for conformal deposition of Mo–Si multilayers on saw-tooth substrates von Voronov, D.L., Anderson, E.H., Gullikson, E.M., Salmassi, F., Warwick, T., Yashchuk, V.V., Padmore, H.A.

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Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins von Nolting, F, Scholl, A, Stöhr, J, Seo, J. W, Fompeyrine, J, Siegwart, H, Locquet, J.-P, Anders, S, Lüning, J, Fullerton, E. E, Toney, M. F, Scheinfein, M. R, Padmore, H. A

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The optics beamline at the Swiss Light Source von Flechsig, U., Jaggi, A., Spielmann, S., Padmore, H.A., MacDowell, A.A.

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High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam von Tamura, N., Padmore, H.A., Patel, J.R.

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Observation of Antiferromagnetic Domains in Epitaxial Thin Films von Scholl, A., Stöhr, J., Lüning, J., Seo, J. W., Fompeyrine, J., Siegwart, H., J.-P. Locquet, Nolting, F., Anders, S., Fullerton, E. E., Scheinfein, M. R., Padmore, H. A.

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Submicron x-ray diffraction and its applications to problems in materials and environmental science von Tamura, N., Celestre, R. S., MacDowell, A. A., Padmore, H. A., Spolenak, R., Valek, B. C., Meier Chang, N., Manceau, A., Patel, J. R.

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Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy von Stöhr, J., Scholl, A., Regan, T. J., Anders, S., Lüning, J., Scheinfein, M. R., Padmore, H. A., White, R. L.

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A new separator design for aberration corrected photoemission electron microscopes von Wan, W., Feng, J., Padmore, H.A.

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Electromigration-induced plastic deformation in passivated metal lines von Valek, B. C., Bravman, J. C., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Spolenak, R., Brown, W. L., Batterman, B. W., Patel, J. R.

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High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction von Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Spolenak, R., Brown, W. L., Marieb, T., Fujimoto, H., Batterman, B. W., Patel, J. R.

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