Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices von Adokanou, K., Inal, K., Montmitonnet, P., Pressecq, F., Bonnet, B., Muraro, J.-L.

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A new method for the hermeticity testing of wafer-level packaging von Lellouchi, Djemel, Dhennin, Jérémie, Lafontan, Xavier, Veyrie, David, Le Neal, Jean-François, Pressecq, Francis

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Characterization and modeling of a CMOS-compatible MEMS technology von Latorre, Laurent, Nouet, Pascal, Bertrand, Yves, Hazard, Philippe, Pressecq, Francis

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Nanoindentation experiments with small tip radii: an experimental method von Martegoutte, Julien, Seguineau, Cedric, Malhaire, Christophe, Fourcade, Thibaut, Desmarres, Jean-Michel, Lafontan, Xavier, Francis, Pressecq

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Mechanical qualification of RF-filters for space applications von Lafontan, X., Kuchenbecker, J., Guillon, B., Pons, P., Nerin, P., Pressecq, F., Dardalhon, M., Rigo, S.

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METHOD AND COMPUTER DEVICE FOR DETERMINING THE RELIABILITY OF A MICROSYSTEM von FOURNIOLS, JEAN-YVES, PRESSECQ, FRANCIS, SCHMITT, PETRA, ESTEVE, DANIEL

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METHOD AND COMPUTER DEVICE FOR DETERMINING THE RELIABILITY OF A MICROSYSTEM von FOURNIOLS, JEAN-YVES, PRESSECQ, FRANCIS, SCHMITT, PETRA, ESTEVE, DANIEL

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