Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique von PRENITZER, B. I, GIANNUZZI, L. A, NEWMAN, K, BROWN, S. R, IRWIN, R. B, SHOFNER, T. L, STEVIE, F. A

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Grain boundary segregation: equilibrium and non-equilibrium conditions von Kempshall, B.W., Prenitzer, B.I., Giannuzzi, L.A.

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Wet thermal oxidation of GaN von Readinger, E. D., Wolter, S. D., Waltemyer, D. L., Delucca, J. M., Mohney, S. E., Prenitzer, B. I., Giannuzzi, L. A., Molnar, R. J.

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Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes von Kempshall, B. W., Giannuzzi, L. A., Prenitzer, B. I., Stevie, F. A., Da, S. X.

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Ion channeling effects on the focused ion beam milling of Cu von Kempshall, B. W., Schwarz, S. M., Prenitzer, B. I., Giannuzzi, L. A., Irwin, R. B., Stevie, F. A.

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Microscale controls on the fate of contaminant uranium in the vadose zone, Hanford Site, Washington von McKinley, James P., Zachara, John M., Liu, Chongxuan, Heald, Steven C., Prenitzer, Brenda I., Kempshall, Brian W.

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