Detection of Ascaris lumbricoides by Capsule Endoscopy von Poliakov, Pavel P., Alimetov, Anar Y., Onopriev, Alexandr V., Avakimyan, Andrey V., Kade, Azamat Kh

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Faster Dissociation:  Measured Rates and Computed Effects on Barriers in Aryl Halide Radical Anions von Takeda, Norihiko, Poliakov, Pavel V, Cook, Andrew R, Miller, John R

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Induced Variability of Cell-to-Cell Interference by Line Edge Roughness in nand Flash Arrays von Poliakov, P., Blomme, P., Pret, A. V., Corbalan, M. M., Gronheid, R., Verkest, D., Van Houdt, J., Dehaene, W.

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Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness von Poliakov, Pavel, Blomme, Pieter, Corbalan, Miguel Miranda, Houdt, Jan Van, Dehaene, Wim

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p -Carborane Conjugation in Radical Anions of Cage–Cage and Cage–Phenyl Compounds von Cook, Andrew R., Valášek, Michal, Funston, Alison M., Poliakov, Pavel, Michl, Josef, Miller, John R.

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p‑Carborane Conjugation in Radical Anions of Cage–Cage and Cage–Phenyl Compounds von Cook, Andrew R, Valášek, Michal, Funston, Alison M, Poliakov, Pavel, Michl, Josef, Miller, John R

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Application of Time-Resolved Linear Dichroism Spectroscopy:  Relaxation of Excited Hexamethylbenzene/1,2,4,5-Tetracyanobenzene Charge-Transfer Complexes von Arnold, Bradley R, Schill, Alexander W, Poliakov, Pavel V

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Application of Time-Resolved Linear Dichroism Spectroscopy:  Rapid Relaxation of Excited Charge Transfer Complexes von Arnold, Bradley R, Euler, Alex, Poliakov, Pavel V, Schill, Alexander W

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Ascaris Lumbricoides Detected by Capsule Endoscopy von Poliakov, Pavel P., Alimetov, Anar Y., Onopriev, Alexandr V., Avakimyan, Andrey V., Kade, Azamat

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Linking EUV lithography line edge roughness and 16 nm NAND memory performance von VAGLIO PRET, Alessandro, POLIAKOV, Pavel, GRONHEID, Roel, BLOMME, Pieter, CORBALAN, Miguel Miranda, DEHAENE, Wim, VERKEST, Diederik, VAN HOUDT, Jan, BIANCHI, Davide

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Modeling and Exploration of Novel Non-Volatile Memory Technologies (Modeling en exploratie voor nieuwe niet-vluchtig geheugen technologieën) von Poliakov, Pavel

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Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories von Poliakov, Pavel, Blomme, Pieter, Pret, Alessandro Vaglio, Corbalan, Miguel Miranda, Gronheid, Roel, Verkest, Diederik, Houdt, Jan Van, Dehaene, Wim

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Linking EUV lithography line edge roughness and 16ANBnm NAND memory performance von Vaglio Pret, Alessandro, Poliakov, Pavel, Gronheid, Roel, Blomme, Pieter, Miranda Corbalan, Miguel, Dehaene, Wim, Verkest, Diederik, Van Houdt, Jan, Bianchi, Davide

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Linking EUV lithography line edge roughness and 16nm NAND memory performance von Vaglio Pret, Alessandro, Poliakov, Pavel, Gronheid, Roel, Blomme, Pieter, Miranda Corbalan, Miguel, Dehaene, Wim, Verkest, Diederik, Van Houdt, Jan, Bianchi, Davide

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Circuit Design for Bias Compatibility in Novel FinFET-Based Floating-Body RAM von Poliakov, P., Anchlia, A., Bardon, M.G., Rooseleer, B., De Wachter, B., Collaert, N., van der Zanden, K., Dehaene, W., Verkest, D., Corbalan, M.M.

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METHOD FOR NON-VOLATILE MEMORY AND MEMORY CONTROLLER SECURED AND AUTHENTICATED PAIRING von POLIAKOV, Pavel, QAWAMI, Shekoufeh, KHATIB ZADEH, Amirali

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FAILURE INDICATOR PREDICTOR (FIP) von Kudryavtsev, Andrey, Qawami, Shekoufeh, Poliakov, Pavel, Khatib Zadeh, Amirali

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ARTIFICIAL INTELLIGENCE BASED MONITORING OF SOLID STATE DRIVES AND DUAL IN-LINE MEMORY MODULES von POLIAKOV, Pavel, KLINKENBORG, Monte, QAWAMI, Shekoufeh, KHATIB ZADEH, Amirali, KUDRYAVTSEV, Andrey

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ARTIFICIAL INTELLIGENCE BASED MONITORING OF SOLID STATE DRIVES AND DUAL IN-LINE MEMORY MODULES von Klinkenborg, Monte, Kudryavtsev, Andrey, Qawami, Shekoufeh, Poliakov, Pavel, Khatib Zadeh, Amirali

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METHOD FOR NON-VOLATILE MEMORY AND MEMORY CONTROLLER SECURED AND AUTHENTICATED PAIRING von POLIAKOV PAVEL, QAWAMI SHEKOUFEH, ZADEH AMIRALI KHATIB

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