A Fourier transform spectrometer without a beam splitter for the vacuum ultraviolet range: From the optical design to the first UV spectrum von de Oliveira, N., Joyeux, D., Phalippou, D., Rodier, J. C., Polack, F., Vervloet, M., Nahon, L.

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Origin of microstructures in picosecond X-ray laser beams von Guilbaud, O, Klisnick, A, Cassou, K, Kazamias, S, Ros, D, Jamelot, G, Joyeux, D, Phalippou, D

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Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources von Dobosz, S., Stabile, H., Tortora, A., Monot, P., Réau, F., Bougeard, M., Merdji, H., Carré, B., Martin, Ph, Joyeux, D., Phalippou, D., Delmotte, F., Gautier, J., Mercier, R.

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Experimental study of the temporal coherence and spectral profile of the 13.9 nm transient X-ray laser von Klisnick, A., Guilbaud, O., Ros, D., Cassou, K., Kazamias, S., Jamelot, G., Lagron, J.-C., Joyeux, D., Phalippou, D., Lechantre, Y., Edwards, M., Mistry, P., Tallents, G.J.

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Longitudinal coherence and spectral profile of a nickel-like silver transient soft X-ray laser von GUILBAUD, O, KLISNICK, A, JOYEUX, D, BENREDJEM, D, CASSOU, K, KAZAMIAS, S, ROS, D, PHALIPPOU, D, JAMELOT, G, MÖLLER, C

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Diagnostics of laser-induced plasma with soft X-ray (13.9 nm) bi-mirror interference microscopy von TANG, H, GUILBAUD, O, SUKEGAWA, K, ISHINO, M, NAGASHIMA, K, DAIDO, H, JAMELOT, G, ROS, D, KLISNICK, A, JOYEUX, D, PHALIPPOU, D, KADO, M, NISHIKINO, M, KIBHIMOTO, M

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Nanometric deformations of thin Nb layers under a strong electric field using soft x-ray laser interferometry von Jamelot, G., Ros, D., Carillon, A., Rus, B., Mocek, T., Kozlová, M., Präg, A. R., Joyeux, D., Phalippou, D., Boussoukaya, M., Kalmykow, M., Ballester, F., Jacques, E.

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Homogeneous focusing with a transient soft X-ray laser for irradiation experiments von Kazamias, S., Cassou, K., Guilbaud, O., Klisnick, A., Ros, D., Plé, F., Jamelot, G., Rus, B., Koslová, M., Stupka, M., Mocek, T., Douillet, D., Zeitoun, Ph, Joyeux, D., Phalippou, D.

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Experimental study of the temporal coherence and spectral profile of the 13.9nm transient X-ray laser von Klisnick, A., Guilbaud, O., Ros, D., Cassou, K., Kazamias, S., Jamelot, G., Lagron, J.-C., Joyeux, D., Phalippou, D., Lechantre, Y., Edwards, M., Mistry, P., Tallents, G.J.

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A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer von De Oliveira, N, Joyeux, D, Phalippou, D, Rodier, J C, Nahon, L, Polack, F, Vervloet, M

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Soft-x-ray interferometer for measuring the refractive index of materials von SVATOS, J, JOYEUX, D, PHALIPPOU, D, POLACK, F

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Investigation of strong electric-field induced surface phenomena by soft X–UV laser interferometry von Zeitoun, Ph, Albert, F., Jaeglé, P., Joyeux, D., Boussoukaya, M., Carillon, A., Hubert, S., Jamelot, G., Klisnick, A., Phalippou, D., Lagron, J.C, Ros, D., Sebban, S., Zeitoun-Fakiris, A.

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Multi-millijoule, deeply saturated x-ray laser at 21.2 nm for applications in plasma physics von Rus, B, Mocek, T, Präg, A R, Kozlová, M, Hudeček, M, Jamelot, G, Carillon, A, Ros, D, Lagron, J-C, Joyeux, D, Phalippou, D

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Interferograms obtained with a X-ray laser by means of a wavefront division interferometer von Albert, F., Joyeux, D., Jaeglé, P., Carillon, A., Chauvineau, J.P., Jamelot, G., Klisnick, A., Lagron, J.C., Phalippou, D., Ros, D., Sebban, S., Zeitoun, P.

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Measurement of the degree of spatial coherence of high-order harmonics using a Fresnel-mirror interferometer von Le Déroff, L., Salières, P., Carré, B., Joyeux, D., Phalippou, D.

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Usefulness of X-ray lasers for science and technology von Jamelot, G., Carillon, A., Jaegle, P., Klisnick, A., Ros, D., Zeitoun, P., Fourcade, P., Hubert, S., Lagron, J.C., Vanbostal, L., Sebban, S., Albert, F., Agostini, P., Garzella, D., Breger, P., Belsky, A., Kamenskikh, I., Joyeux, D., Phalippou, D., Boussoukaya, M., Zeitoun-Fakiris, A., de Lacheze-Murel, G., Bechir, E.

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A method for splitting a gaussian laser beam into two coherent uniform beams von Château, N., Phalippou, D., Chavel, P.

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An interferometric determination of the refractive part of optical constants for carbon and silver across soft x-ray absorption edges von Joyeux, Denis, Polack, François, Phalippou, Daniel

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Nanometric deformations of thin niobium layers under a strong electric field using soft X-ray laser interferometry von Jamelot, Gérard, Ros, David, Carillon, A., Koslova, M., Mocek, T., Rus, B., Prag, A.R, Joyeux, D., Phalippou, D., Boussoukaya, M., Kalmykow, M., Ballester, F., Jacques, E.

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Multimillijoule, highly coherent x-ray laser at 21 nm operating in deep saturation through double-pass amplification von Rus, B., Mocek, T., Präg, A. R., Kozlová, M., Jamelot, G., Carillon, A., Ros, D., Joyeux, D., Phalippou, D.

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