Iterative process for identifying systematics in data von KASSAB MAROUN, PASTEL LEAH M. PFEIFER

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ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA von KASSAB MAROUN, PFEIFER PASTEL LEAH M

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PASTEL LEAH M. PFEIFER

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von Huisman, Leendert M, Huott, William V, Motika, Franco, Pastel, Leah M. Pfeifer

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USING CLOCK GATING OR SIGNAL GATING TO PARTITION A DEVICE FOR FAULT ISOLATION AND DIAGNOSTIC DATA COLLECTION von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PFEIFER PASTEL LEAH M

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Learning based logic diagnosis von KASSAB MAROUN, COHN JOHN M, HUISMAN LEENDERT M, SWEENOR DAVID E, ADKISSON JAMES W, PFEIFER PASTEL LEAH M

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Learning based logic diagnosis von Adkisson, James W, Cohn, John M, Huisman, Leendert M, Kassab, Maroun, Pfeifer Pastel, Leah M, Sweenor, David E

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PFEIFER PASTEL LEAH M

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PFEIFER PASTEL LEAH M

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PASTEL LEAH M. PFEIFER

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PASTEL LEAH M. PFEIFER

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Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection von HUISMAN LEENDERT M, HUOTT WILLIAM V, MOTIKA FRANCO, PFEIFER PASTEL LEAH M

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Diagnosing failure locations of an integrated circuit with logic built-in self-test von Pfeifer Pastel, Leah Marie, Douskey, Steven M, Kaufer, Amanda R

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