Direct measurement of intrinsic atomic scale magnetostriction von Ruffoni, M P, Pascarelli, S, Grössinger, R, Turtelli, R Sato, Bormio-Nunes, C, Pettifer, R F

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Calibration of spectra from dispersive XAS beamlines von Ruffoni, M. P., Pettifer, R. F.

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Size-controlled percolation pathways for electrical conduction in porous silicon von Hamilton, B., Jacobs, J., Hill, D. A., Pettifer, R. F., Teehan, D., Canham, L. T.

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Sputter deposition of compositional gradient magnetostrictive FeCo based thin films von Cooke, M.D., Gibbs, M.R.J., Pettifer, R.F.

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Effect of pressure on magnetoelastic coupling in 3d metal alloys studied with x-ray absorption spectroscopy von Pascarelli, S, Ruffoni, M P, Trapananti, A, Mathon, O, Aquilanti, G, Ostanin, S, Staunton, J B, Pettifer, R F

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Probing atomic displacements with thermal differential EXAFS von Ruffoni, M. P., Pettifer, R. F., Pascarelli, S., Trapananti, A., Mathon, O.

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Direct demonstration of the transverse Stern–Gerlach effect von Porter, J., Pettifer, R. F., Leadley, D. R.

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Borrmann spectroscopy von Collins, S P, Tolkiehn, M, Pettifer, R F, Laundy, D

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Determination of the Si–O–Si bond angle distribution in vitreous silica by magic angle spinning NMR von Dupree, E., Pettifer, R. F.

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An EXAFS calculation using known four-body correlations von Loeffen, PW, Pettifer, RF

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Verifying DiffEXAFS measurements with differential X-ray diffraction von Ruffoni, M. P., Pettifer, R. F., Pascarelli, S., Mathon, O.

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The physics of ionization chambers - or how to improve your signal-to-noise ratio for transmission EXAFS measurements von Pettifer, R. F., Borowski, M., Loeffen, P. W.

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An Introduction to Differential EXAFS von Ruffoni, M P, Pettifer, R F, Pascarelli, S, Trapananti, A, Mathon, O

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The structure of soda-silica glasses: A mas NMR study von Dupree, R., Holland, D., McMillan, P.W., Pettifer, R.F.

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Chemical nature of the luminescent centre in fresh and aged porous silicon layers von Gardelis, S., Bangert, U., Hamilton, B., Pettifer, R.F., Hill, D.A., Keyse, R., Teehan, D.

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CHOOCH: a program for deriving anomalous-scattering factors from X-ray fluorescence spectra von Evans, Gwyndaf, Pettifer, Robert F.

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X-ray excited optical luminescence (XEOL) study of porous silicon von Pettifer, R.F., Glanfield, A., Gardelis, S., Hamilton, B., Dawson, P., Smith, A.D.

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Measurement of femtometre-scale atomic displacements by X-ray absorption spectroscopy von Pettifer, Robert F., Mathon, Olivier, Pascarelli, Sakura, Cooke, Michael D., Gibbs, Michael R. J.

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Extended X‐ray absorption fine structure (EXAFS) investigations of model compounds for zinc enzymes von EGGERS‐BORKENSTEIN, Peter, PRIGGEMEYER, Stefan, KREBS, Bernt, HENKEL, Gerald, SIMONIS, Ursula, PETTIFER, Robert F., NOLTING, Hans‐Friedrich, HERMES, Christoph

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NMR determinations of Si[sbnd]O[sbnd]Si bond angle distributions in silica von Pettifer, R.F., Dupree, R., Farnan, I., Sternberg, U.

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