Determination of the temperature coefficient of resistance from micro four-point probe measurements von Marangoni, Thomas A., Guralnik, Benny, Borup, Kasper A., Hansen, Ole, Petersen, Dirch H.

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Graphene mobility mapping von Buron, Jonas D., Pizzocchero, Filippo, Jepsen, Peter U., Petersen, Dirch H., Caridad, José M., Jessen, Bjarke S., Booth, Timothy J., Bøggild, Peter

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Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gate von Buron, Jonas D, Mackenzie, David M A, Petersen, Dirch H, Pesquera, Amaia, Centeno, Alba, Bøggild, Peter, Zurutuza, Amaia, Jepsen, Peter U

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Eliminating resistance measurement error due to thermoelectric effects in micro four-point probe measurements von Lamba, Neetu, Guralnik, Benny, Prado-Gonjal, Jesús, Powell, Anthony V., Pryds, Nini, Hansen, Ole, Petersen, Dirch H., Beltrán-Pitarch, Braulio

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Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe von Beltrán-Pitarch, Braulio, Guralnik, Benny, Borup, Kasper A, Adelmann, Christoph, Hansen, Ole, Pryds, Nini, Petersen, Dirch H

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Fast micro Hall effect measurements on small pads von Westergaard Østerberg, Frederik, Hjorth Petersen, Dirch, Nielsen, Peter F., Rosseel, Erik, Vandervorst, Wilfried, Hansen, Ole

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Atomic Layer Deposition of Ruthenium with TiN Interface for Sub-10 nm Advanced Interconnects beyond Copper von Wen, Liang Gong, Roussel, Philippe, Pedreira, Olalla Varela, Briggs, Basoene, Groven, Benjamin, Dutta, Shibesh, Popovici, Mihaela I, Heylen, Nancy, Ciofi, Ivan, Vanstreels, Kris, Østerberg, Frederik W, Hansen, Ole, Petersen, Dirch H, Opsomer, Karl, Detavernie, Christophe, Wilson, Christopher J, Elshocht, Sven Van, Croes, Kristof, Bömmels, Jürgen, Tőkei, Zsolt, Adelmann, Christoph

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Patched Green's function techniques for two-dimensional systems: Electronic behavior of bubbles and perforations in graphene von Settnes, Mikkel, Power, Stephen R., Lin, Jun, Petersen, Dirch H., Jauho, Antti-Pekka

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Mapping the electrical properties of large-area graphene von Bøggild, Peter, Mackenzie, David M A, Whelan, Patrick R, Petersen, Dirch H, Buron, Jonas Due, Zurutuza, Amaia, Gallop, John, Hao, Ling, Jepsen, Peter U

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Graphene Conductance Uniformity Mapping von Buron, Jonas D, Petersen, Dirch H, Bøggild, Peter, Cooke, David G, Hilke, Michael, Sun, Jie, Whiteway, Eric, Nielsen, Peter F, Hansen, Ole, Yurgens, August, Jepsen, Peter U

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Theoretical analysis of a dual-probe scanning tunneling microscope setup on graphene von Settnes, Mikkel, Power, Stephen R, Petersen, Dirch H, Jauho, Antti-Pekka

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Electrically Continuous Graphene from Single Crystal Copper Verified by Terahertz Conductance Spectroscopy and Micro Four-Point Probe von Buron, Jonas D, Pizzocchero, Filippo, Jessen, Bjarke S, Booth, Timothy J, Nielsen, Peter F, Hansen, Ole, Hilke, Michael, Whiteway, Eric, Jepsen, Peter U, Bøggild, Peter, Petersen, Dirch H

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Effective electrical resistivity in a square array of oriented square inclusions von Guralnik, Benny, Hansen, Ole, Henrichsen, Henrik H, Caridad, José M, Wei, Wilson, Hansen, Mikkel F, Nielsen, Peter F, Petersen, Dirch H

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Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide von Whelan, Patrick R, Panchal, Vishal, Petersen, Dirch H, Mackenzie, David M. A, Melios, Christos, Pasternak, Iwona, Gallop, John, Østerberg, Frederik W, U. Jepsen, Peter, Strupinski, Wlodek, Kazakova, Olga, Bøggild, Peter

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Determination of thermoelectric properties from micro four-point probe measurements von Guralnik, Benny, Hansen, Ole, Stilling-Andersen, Andreas R, Hansen, Søren E, Borup, Kasper A, Mihiretie, Besira M, Beltrán-Pitarch, Braulio, Henrichsen, Henrik H, Lin, Rong, Shiv, Lior, Iversen, Bo B, Nielsen, Peter F, Petersen, Dirch H

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Wafer-scale graphene quality assessment using micro four-point probe mapping von Mackenzie, David M A, Kalhauge, Kristoffer G, Whelan, Patrick R, Østergaard, Frederik W, Pasternak, Iwona, Strupinski, Wlodek, Bøggild, Peter, Jepsen, Peter U, Petersen, Dirch H

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Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy von Whelan, Patrick R, Zhou, Binbin, Bezencenet, Odile, Shivayogimath, Abhay, Mishra, Neeraj, Shen, Qian, Jessen, Bjarke S, Pasternak, Iwona, Mackenzie, David M A, Ji, Jie, Sun, Cunzhi, Seneor, Pierre, Dlubak, Bruno, Luo, Birong, Østerberg, Frederik W, Huang, Deping, Shi, Haofei, Luo, Da, Wang, Meihui, Ruoff, Rodney S, Conran, Ben R, McAleese, Clifford, Huyghebaert, Cedric, Brems, Steven, Booth, Timothy J, Napal, Ilargi, Strupinski, Wlodek, Petersen, Dirch H, Forti, Stiven, Coletti, Camilla, Jouvray, Alexandre, Teo, Kenneth B K, Centeno, Alba, Zurutuza, Amaia, Legagneux, Pierre, Jepsen, Peter U, Bøggild, Peter

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Quality assessment of graphene： Continuity, uniformity, and accuracy of mobility measurements von Mackenzie, David M. A., Buron, Jonas D., Whelan, Patrick R., Caridad, José M., Bjergfelt, Martin, Luo, Birong, Shivayogimath, Abhay, Smitshuysen, Anne L., Thomsen, Joachim D., Booth, Timothy J., Gammelgaard, Lene, Zultak, Johanna, Jessen, Bjarke S., Bøggild, Peter, Petersen, Dirch H.

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Dual-probe spectroscopic fingerprints of defects in graphene von Settnes, Mikkel, Power, Stephen R., Petersen, Dirch H., Jauho, Antti-Pekka

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Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithm von Cagliani, Alberto, Østerberg, Frederik W., Hansen, Ole, Shiv, Lior, Nielsen, Peter F., Petersen, Dirch H.

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