Determination of the temperature coefficient of resistance from micro four-point probe measurements von Marangoni, Thomas A., Guralnik, Benny, Borup, Kasper A., Hansen, Ole, Petersen, Dirch H.

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Graphene mobility mapping von Buron, Jonas D., Pizzocchero, Filippo, Jepsen, Peter U., Petersen, Dirch H., Caridad, José M., Jessen, Bjarke S., Booth, Timothy J., Bøggild, Peter

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Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gate von Buron, Jonas D, Mackenzie, David M A, Petersen, Dirch H, Pesquera, Amaia, Centeno, Alba, Bøggild, Peter, Zurutuza, Amaia, Jepsen, Peter U

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Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe von Beltrán-Pitarch, Braulio, Guralnik, Benny, Borup, Kasper A, Adelmann, Christoph, Hansen, Ole, Pryds, Nini, Petersen, Dirch H

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Eliminating resistance measurement error due to thermoelectric effects in micro four-point probe measurements von Lamba, Neetu, Guralnik, Benny, Prado-Gonjal, Jesús, Powell, Anthony V., Pryds, Nini, Hansen, Ole, Petersen, Dirch H., Beltrán-Pitarch, Braulio

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Patched Green's function techniques for two-dimensional systems: Electronic behavior of bubbles and perforations in graphene von Settnes, Mikkel, Power, Stephen R., Lin, Jun, Petersen, Dirch H., Jauho, Antti-Pekka

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Atomic Layer Deposition of Ruthenium with TiN Interface for Sub-10 nm Advanced Interconnects beyond Copper von Wen, Liang Gong, Roussel, Philippe, Pedreira, Olalla Varela, Briggs, Basoene, Groven, Benjamin, Dutta, Shibesh, Popovici, Mihaela I, Heylen, Nancy, Ciofi, Ivan, Vanstreels, Kris, Østerberg, Frederik W, Hansen, Ole, Petersen, Dirch H, Opsomer, Karl, Detavernie, Christophe, Wilson, Christopher J, Elshocht, Sven Van, Croes, Kristof, Bömmels, Jürgen, Tőkei, Zsolt, Adelmann, Christoph

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Graphene Conductance Uniformity Mapping von Buron, Jonas D, Petersen, Dirch H, Bøggild, Peter, Cooke, David G, Hilke, Michael, Sun, Jie, Whiteway, Eric, Nielsen, Peter F, Hansen, Ole, Yurgens, August, Jepsen, Peter U

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Mapping the electrical properties of large-area graphene von Bøggild, Peter, Mackenzie, David M A, Whelan, Patrick R, Petersen, Dirch H, Buron, Jonas Due, Zurutuza, Amaia, Gallop, John, Hao, Ling, Jepsen, Peter U

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Theoretical analysis of a dual-probe scanning tunneling microscope setup on graphene von Settnes, Mikkel, Power, Stephen R, Petersen, Dirch H, Jauho, Antti-Pekka

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Electrically Continuous Graphene from Single Crystal Copper Verified by Terahertz Conductance Spectroscopy and Micro Four-Point Probe von Buron, Jonas D, Pizzocchero, Filippo, Jessen, Bjarke S, Booth, Timothy J, Nielsen, Peter F, Hansen, Ole, Hilke, Michael, Whiteway, Eric, Jepsen, Peter U, Bøggild, Peter, Petersen, Dirch H

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Effective electrical resistivity in a square array of oriented square inclusions von Guralnik, Benny, Hansen, Ole, Henrichsen, Henrik H, Caridad, José M, Wei, Wilson, Hansen, Mikkel F, Nielsen, Peter F, Petersen, Dirch H

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Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide von Whelan, Patrick R, Panchal, Vishal, Petersen, Dirch H, Mackenzie, David M. A, Melios, Christos, Pasternak, Iwona, Gallop, John, Østerberg, Frederik W, U. Jepsen, Peter, Strupinski, Wlodek, Kazakova, Olga, Bøggild, Peter

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Determination of thermoelectric properties from micro four-point probe measurements von Guralnik, Benny, Hansen, Ole, Stilling-Andersen, Andreas R, Hansen, Søren E, Borup, Kasper A, Mihiretie, Besira M, Beltrán-Pitarch, Braulio, Henrichsen, Henrik H, Lin, Rong, Shiv, Lior, Iversen, Bo B, Nielsen, Peter F, Petersen, Dirch H

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Quality assessment of graphene： Continuity, uniformity, and accuracy of mobility measurements von Mackenzie, David M. A., Buron, Jonas D., Whelan, Patrick R., Caridad, José M., Bjergfelt, Martin, Luo, Birong, Shivayogimath, Abhay, Smitshuysen, Anne L., Thomsen, Joachim D., Booth, Timothy J., Gammelgaard, Lene, Zultak, Johanna, Jessen, Bjarke S., Bøggild, Peter, Petersen, Dirch H.

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Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy von Whelan, Patrick R, Zhou, Binbin, Bezencenet, Odile, Shivayogimath, Abhay, Mishra, Neeraj, Shen, Qian, Jessen, Bjarke S, Pasternak, Iwona, Mackenzie, David M A, Ji, Jie, Sun, Cunzhi, Seneor, Pierre, Dlubak, Bruno, Luo, Birong, Østerberg, Frederik W, Huang, Deping, Shi, Haofei, Luo, Da, Wang, Meihui, Ruoff, Rodney S, Conran, Ben R, McAleese, Clifford, Huyghebaert, Cedric, Brems, Steven, Booth, Timothy J, Napal, Ilargi, Strupinski, Wlodek, Petersen, Dirch H, Forti, Stiven, Coletti, Camilla, Jouvray, Alexandre, Teo, Kenneth B K, Centeno, Alba, Zurutuza, Amaia, Legagneux, Pierre, Jepsen, Peter U, Bøggild, Peter

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Wafer-scale graphene quality assessment using micro four-point probe mapping von Mackenzie, David M A, Kalhauge, Kristoffer G, Whelan, Patrick R, Østergaard, Frederik W, Pasternak, Iwona, Strupinski, Wlodek, Bøggild, Peter, Jepsen, Peter U, Petersen, Dirch H

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3ω correction method for eliminating resistance measurement error due to Joule heating von Guralnik, Benny, Hansen, Ole, Henrichsen, Henrik H., Beltrán-Pitarch, Braulio, Østerberg, Frederik W., Shiv, Lior, Marangoni, Thomas A., Stilling-Andersen, Andreas R., Cagliani, Alberto, Hansen, Mikkel F., Nielsen, Peter F., Oprins, Herman, Vermeersch, Bjorn, Adelmann, Christoph, Dutta, Shibesh, Borup, Kasper A., Mihiretie, Besira M., Petersen, Dirch H.

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Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithm von Cagliani, Alberto, Østerberg, Frederik W., Hansen, Ole, Shiv, Lior, Nielsen, Peter F., Petersen, Dirch H.

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Dual-probe spectroscopic fingerprints of defects in graphene von Settnes, Mikkel, Power, Stephen R., Petersen, Dirch H., Jauho, Antti-Pekka

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