Treffer 1 - 20 von 2.337 für Suche 'PETER A. ROSENTHAL', Suchdauer: 1,85s Treffer weiter einschränken
  1. 1
    Sinusitis as Potential Risk Factor for Stroke—Relationship to Underlying Periodontitis

    Sinusitis as Potential Risk Factor for Stroke—Relationship to Underlying Periodontitis von Rosenthal, Peter A.


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  2. 2
    Incidental paranasal sinusitis on routine brain magnetic resonance scans: association with atherosclerosis

    Incidental paranasal sinusitis on routine brain magnetic resonance scans: association with atherosclerosis von Rosenthal, Peter A., Lundy, Katherine C., Massoglia, Dino P., Payne, Elizabeth H., Gilbert, Gregory, Gebregziabher, Mulugeta


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  3. 3
    Flux focusing effects in planar thin-film grain-boundary Josephson junctions

    Flux focusing effects in planar thin-film grain-boundary Josephson junctions von Rosenthal, Peter A., Beasley, M. R., Char, K., Colclough, M. S., Zaharchuk, G.

    Veröffentlicht in Applied physics letters

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  4. 4
    An Introduction to Operators on the Hardy-Hilbert Space

    An Introduction to Operators on the Hardy-Hilbert Space von Martínez-Avendaño, Rubén A., Rosenthal, Peter


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  5. 5
    Real-time etch-depth measurements of MEMS devices

    Real-time etch-depth measurements of MEMS devices von Bosch-Charpenay, S., Jiazhan Xu, Haigis, J., Rosenthal, P.A., Solomon, P.R., Bustillo, J.M.


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  6. 6
    A Readable Introduction to Real Mathematics

    A Readable Introduction to Real Mathematics von Rosenthal, Daniel, Rosenthal, David, Rosenthal, Peter


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  7. 7
    A Readable Introduction to Real Mathematics

    A Readable Introduction to Real Mathematics von Rosenthal, Daniel


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  8. 8
    A Glimpse at Hilbert Space Operators: Paul R. Halmos in Memoriam

    A Glimpse at Hilbert Space Operators: Paul R. Halmos in Memoriam von Axler, Sheldon, Rosenthal, Peter, Sarason, Donald

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  9. 9
    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES

    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES von ROSENTHAL, PETER, A, XU, JIAZHAN

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  10. 10
    Invariant Subspaces

    Invariant Subspaces von Radjavi, Heydar, Rosenthal, Peter


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  11. 11
    METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS

    METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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  12. 12
    Exhaust gas monitoring: new window into semiconductor processing

    Exhaust gas monitoring: new window into semiconductor processing von Richter, Matt, Spartz, Martin L, Solomon, Peter R, Rosenthal, Peter A, Nelson, Chad, Perry, Andrew, Mundt, Randall

    Veröffentlicht in Solid state technology

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  13. 13
    Erratum: Flux focusing effects in planar thin-film grain-boundary Josephson junctions [Appl. Phys. Lett. 59 , 3482 (1991)]

    Erratum: Flux focusing effects in planar thin-film grain-boundary Josephson junctions [Appl. Phys. Lett. 59 , 3482 (1991)] von Rosenthal, Peter A., Beasley, M. R., Char, K., Colclough, M. S., Zaharchuk, G.

    Veröffentlicht in Applied physics letters

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  14. 14
    Kinetic inductance memory cell

    Kinetic inductance memory cell von Chen, G.J., Rosenthal, P.A., Beasley, M.R.


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  15. 15
    METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS

    METHOD AND APPARATUS FOR MEASURING THE COMPOSITION AND OTHER PROPERTIES OF THIN FILMS von ROSENTHAL, PETER, A, CHARPENAY, SYLVIE, YAKOVLEV, VICTOR, A

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  16. 16
    High Temperature Superconducting Josephson Junctions on Silicon Substrates for RF Communications

    High Temperature Superconducting Josephson Junctions on Silicon Substrates for RF Communications von Rosenthal, Peter A

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    Report

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  17. 17
    Thermal imaging for semiconductor process monitoring

    Thermal imaging for semiconductor process monitoring von Rosenthal, Peter A, Xu, Jiazhan, Charpenay, Sylvie, Cosgrove, Joseph E

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  18. 18
    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES

    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES von ROSENTHAL, PETER, A, XU, JIAZHAN

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  19. 19
    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES

    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES von ROSENTHAL, PETER, A, XU, JIAZHAN

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  20. 20
    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES

    METHOD AND APPARATUS FOR PERFORMING OPTICAL MEASUREMENTS OF LAYERS AND SURFACE PROPERTIES von ROSENTHAL, PETER, A, XU, JIAZHAN

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