Editorial von Bafleur, Marise, Perdu, Philippe, Marc, François, Fremont, Hélène, Nolhier, Nicolas

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Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015 von Bafleur, Marise, Perdu, Philippe, Marc, François, Frémont, Hélène, Nolhier, Nicolas

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Automatic process for time-frequency scan of VLSI von Boscaro, Anthony, Jacquir, Sabir, Melendez, Kevin, Sanchez, Kevin, Perdu, Philippe, Binczak, Stéphane

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A way to implement the electro-optical technique to inertial MEMS von Melendez, K., Desmoulin, A., Sanchez, K., Perdu, P., Lewis, D.

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Automatic localization of signal sources in photon emission images for integrated circuit analysis von Boscaro, Anthony, Jacquir, Sabir, Chef, Samuel, Sanchez, Kevin, Perdu, Philippe, Binczak, Stéphane

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Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location von Chef, Samuel, Jacquir, Sabir, Sanchez, Kevin, Perdu, Philippe, Binczak, Stéphane

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Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell von EL MOUKHTARI, I, POUGET, V, LARUE, C, DARRACQ, F, LEWIS, D, PERDU, P

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Frequency mapping in dynamic light emission with wavelet transform von Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.

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Pattern image enhancement by extended depth of field von Chef, S., Billiot, B., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.

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Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation von Infante, F., Perdu, Philippe, Lewis, Dean

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Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology von El Moukhtari, I., Pouget, Vincent, Darracq, Frederic, Larue, Camille, Perdu, Philippe, Lewis, Dean

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A comprehensive study of the application of the EOP techniques on bipolar devices von Rebaï, M.M., Darracq, F., Guillet, J.-P., Bernou, E., Sanchez, K., Perdu, P., Lewis, D.

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VLSI functional analysis by dynamic emission microscopy von Perdu, Philippe, DiBattista, Jérôme, Dudit, Sylvain, Nakamura, Tomonori

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Influence of Laser Pulse Duration in Single Event Upset Testing von Douin, A., Pouget, V., Darracq, F., Lewis, D., Fouillat, P., Perdu, P.

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Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis von Bascoul, G., Perdu, P., Benigni, A., Dudit, S., Celi, G., Lewis, D.

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Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below) von Celi, Guillaume, Dudit, Sylvain, Perdu, Philippe, Reverdy, Antoine, Parrassin, Thierry, Bechet, Emmanuel, Lewis, Dean, Vallet, Michel

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Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques von Bouya, M., Malbert, N., Labat, N., Carisetti, D., Perdu, P., Clément, J.C., Lambert, B., Bonnet, M.

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CADless laser assisted methodologies for failure analysis and device reliability von Deyine, A., Sanchez, K., Perdu, P., Battistella, F., Lewis, D.

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LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis von Celi, Guillaume, Dudit, Sylvain, Parrassin, Thierry, Perdu, Philippe, Reverdy, Antoine, Lewis, Dean, Vallet, Michel

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Laser-Based Target Preparation in 3D Integrated Electronic Packages von Martens, Stefan, Mack, Walter, Courtade, Frédéric, Perdu, Philippe, Wilde, Juergen, Voelklein, Friedemann

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