Structure in Thin and Ultrathin Spin-Cast Polymer Films von Frank, C. W., Rao, V., Despotopoulou, M. M., Pease, R. F. W., Hinsberg, W. D., Miller, R. D., Rabolt, J. F.

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Secondary electron detection for distributed axis electron beam systems von Tanimoto, S., Pickard, D.S., Kenney, C., Pease, R.F.W.

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Lamellar crystallization of silicon for 3-dimensional integration von Witte, D.J., Crnogorac, F., Pickard, D.S., Mehta, A., Liu, Z., Rajendran, B., Pianetta, P., Pease, R.F.W.

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Nano-graphoepitaxy of semiconductors for 3D integration von Crnogorac, F., Witte, D.J., Xia, Q., Rajendran, B., Pickard, D.S., Liu, Z., Mehta, A., Sharma, S., Yasseri, A., Kamins, T.I., Chou, S.Y., Pease, R.F.W.

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Electron scattering study within the depletion region of the GaN(0001) and the GaAs(100) surface von Liu, Zhi, Machuca, Francisco, Pianetta, Piero, Spicer, William E., Pease, R. F. W.

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Ab initio modeling of the interaction of electron beams and single-walled carbon nanotubes von Nojeh, A, Shan, B, Cho, K, Pease, R F W

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Magnetic penetration depth measurements of superconducting thin films by a microstrip resonator technique von Langley, B.W., Anlage, S. M., Pease, R. F. W., Beasley, M. R.

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Self-limiting oxidation for fabricating sub-5 nm silicon nanowires von Liu, H. I., Biegelsen, D. K., Ponce, F. A., Johnson, N. M., Pease, R. F. W.

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Shot noise models for sequential processes and the role of lateral mixing von Neureuther, A. R., Pease, R. F. W., Yuan, L., Baghbani Parizi, K., Esfandyarpour, H., Poppe, W. J., Liddle, J. A., Anderson, E. H.

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Scanning tunneling microscope as a micromechanical tool von MCCORD, M. A, PEASE, R. F. W

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Imaging and modification of polymers by scanning tunneling and atomic force microscopy von ALBRECHT, T. R, DOVEK, M. M, LANG, C. A, GRÜTTER, P, QUATE, C. F, KUAN, S. W. J, FRANK, C. W, PEASE, R. F. W

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Simple method for cleaning gallium nitride (0001) von Machuca, Francisco, Liu, Zhi, Sun, Yun, Pianetta, P., Spicer, W. E., Pease, R. F. W.

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Monolithic multichannel secondary electron detector for distributed axis electron beam lithography and inspection von Pickard, D. S., Kenney, C., Tanimoto, S., Crane, T., Groves, T., Pease, R. F. W.

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Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubes von Wong, W. K., Nojeh, A., Pease, R. F. W.

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Computational Scanning Electron Microscopy von Rad, Leili Baghaei, Feng, Hanying, Ye, Jun, Pease, R F W

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Empirical forms for the electron/atom elastic scattering cross sections from 0.1 to 30 keV von Browning, R., Li, T. Z., Chui, B., Ye, Jun, Pease, R. F. W., Czyżewski, Z., Joy, D. C.

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Unequally Spaced Waveguide Arrays for Silicon Nanomembrane-Based Efficient Large Angle Optical Beam Steering von Hosseini, A., Kwong, D., Yang Zhao, Yun-Sheng Chen, Crnogorac, F., Pease, R.F.W., Chen, R.T.

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Observation of electron resonant tunneling in a lateral dual-gate resonant tunneling field-effect transistor von CHOU, S. Y, ALLEE, D. R, PEASE, R. F. W, HARRIS, J. S

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Comment on "Ultrahigh secondary electron emission of carbon nanotubes" [ Appl. Phys. Lett. 96 , 213113 ( 2010 ) ] von Alam, M. K., Pease, R. F. W., Nojeh, A.

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Semiconductor crystal islands for three-dimensional integration von Crnogorac, F., Wong, S., Pease, R. F. W.

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