ON-CHIP DISTRIBUTION OF TEST DATA FOR MULTIPLE DIES von PAYAKAPAN, Tassanee, CHAO, Yuan, MARGULIS, Arie

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ON-CHIP DISTRIBUTION OF TEST DATA FOR MULTIPLE DIES von PAYAKAPAN, Tassanee, CHAO, Yuan, MARGULIS, Arie

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ON-CHIP DISTRIBUTION OF TEST DATA FOR MULTIPLE DIES von PAYAKAPAN, Tassanee, MARGULIS, Arie, Chao, Yuan

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SELECTIVE SCAN INSERTION FOR RAPID SCAN DESIGN VERIFICATION von Payakapan, Tassanee, Margulis, Arie, Akselrod, David, Robinson, Chad

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다수의 다이들에 대한 테스트 데이터의 온-칩 분배 von CHAO YUAN, MARGULIS ARIE, PAYAKAPAN TASSANEE

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Circuit for and method of testing for faults in a programmable logic device von Payakapan, Tassanee, Hartanto, Ismed D, Toutounchi, Shahin

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Circuit for and method of testing for faults in a programmable logic device von HARTANTO ISMED D, TOUTOUNCHI SHAHIN, PAYAKAPAN TASSANEE

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Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration von Payakapan, Tassanee, Chung, Lee Ni, Toutounchi, Shahin

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Testing of a programmable device von Wells, Robert W, Bapat, Shekhar, Payakapan, Tassanee, Toutounchi, Shahin

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Testing of a programmable device von BAPAT SHEKHAR, WELLS ROBERT W, TOUTOUNCHI SHAHIN, PAYAKAPAN TASSANEE

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Testing of a programmable device von Wells, Robert W, Bapat, Shekhar, Payakapan, Tassanee, Toutounchi, Shahin

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Testing of a programmable device von BAPAT SHEKHAR, WELLS ROBERT W, TOUTOUNCHI SHAHIN, PAYAKAPAN TASSANEE

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Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration von CHUNG LEE NI, TOUTOUNCHI SHAHIN, PAYAKAPAN TASSANEE

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