Thermal hysteresis measurement of the VO2 dielectric function for its metal-insulator transition by visible-IR ellipsometry von Ramirez-Rincon, J. A., Gomez-Heredia, C. L., Corvisier, A., Ordonez-Miranda, J., Girardeau, T., Paumier, F., Champeaux, C., Dumas-Bouchiat, F., Ezzahri, Y., Joulain, K., Ares, O., Alvarado-Gil, J. J.

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Disorder–order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects von Gaboriaud, R.J., Paumier, F., Lacroix, B.

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Adolescent injuries in Argentina, Bolivia, Chile, and Uruguay: Results from the 2012–2013 Global School-based Student Health Survey (GSHS) von Beck, Naja I., M.S, Arif, Issra, M.S, Paumier, Michelle F., M.S, Jacobsen, Kathryn H., Ph.D

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Nanostructure and Physical Properties Control of Indium Tin Oxide Films Prepared at Room Temperature through Ion Beam Sputtering Deposition at Oblique Angles von Lacroix, B, Santos, A. J, Hurand, S, Corvisier, A, Paumier, F, Girardeau, T, Maudet, F, Dupeyrat, C, García, R, Morales, F. M

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Towards perfect MWIR transparency using oblique angle deposition von Maudet, F., Lacroix, B., Santos, A.J., Paumier, F., Paraillous, M., Dupeyrat, C., García, R., Morales, F.M., Girardeau, T.

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Ion irradiation-induced phase transformation mechanisms in Y2O3 thin films von Gaboriaud, R.J., Paumier, F., Jublot, M., Lacroix, B.

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Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability von Gaboriaud, R.J., Paumier, F., Lacroix, B.

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Influence of composition, bonding characteristics and microstructure on the electrochemical and optical stability of AlOxNy thin films von Borges, J., Fonseca, C., Barradas, N.P., Alves, E., Girardeau, T., Paumier, F., Vaz, F., Marques, L.

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Swift heavy ion induced recrystallization in cubic silicon carbide: New insights from designed experiments and MD simulations von Debelle, A., Backman, M., Thomé, L., Nordlund, K., Djurabekova, F., Weber, W.J., Monnet, I., Pakarinen, O.H., Garrido, F., Paumier, F.

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Microstructural and conductivity changes induced by annealing of ZnO:B thin films deposited by chemical vapour deposition von David, C, Girardeau, T, Paumier, F, Eyidi, D, Lacroix, B, Papathanasiou, N, Tinkham, B P, Guérin, P, Marteau, M

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Modification of electrical properties induced by annealing of ZnO:B thin films deposited by chemical vapour deposition: Kinetic investigation of evolution von David, C., Paumier, F., Tinkham, B.P., Eyidi, D., Marteau, M., Guérin, P., Girardeau, T.

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Y2O3 thin films: internal stress and microstructure von Gaboriaud, R.J, Paumier, F, Pailloux, F, Guerin, P

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Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure von Jublot, M., Paumier, F., Pailloux, F., Lacroix, B., Leau, E., Guérin, P., Marteau, M., Jaouen, M., Gaboriaud, R.J., Imhoff, D.

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Microstructure of (Ti,Si,Al)N nanocomposite coatings von Carvalho, S, Rebouta, L, Ribeiro, E, Vaz, F, Denannot, M.F, Pacaud, J, Rivière, J.P, Paumier, F, Gaboriaud, R.J, Alves, E

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Structure and properties of nitrogen-doped titanium dioxide thin films produced by reactive magnetron sputtering von Abadias, G., Paumier, F., Eyidi, D., Guérin, P., Girardeau, T.

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Yttrium oxide thin films, Y2O3, grown by ion beam sputtering on Si von Gaboriaud, R J, Pailloux, F, Guerin, P, Paumier, F

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Magnetic properties of exchange biased and of unbiased oxide/permalloy thin layers: a ferromagnetic resonance and Brillouin scattering study von Zighem, F, Roussigné, Y, Chérif, S-M, Moch, P, Ben Youssef, J, Paumier, F

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Yttrium sesquioxide, Y2O3, thin films deposited on Si by ion beam sputtering: microstructure and dielectric properties von GABORIAUD, R. J, PAILLOUX, F, GUERIN, P, PAUMIER, F

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Interfacial reactions in Y2O3 thin films deposited on Si(100) von PAUMIER, F, GABORIAUD, R. J

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In situ electrical and mechanical study of Indium Tin Oxide films deposited on polyimide substrate by Xe ion beam sputtering von Chommaux, T., Renault, P.O., Thiaudière, D., Godard, P., Paumier, F., Girardeau, T., Hurand, S., Goudeau, PH

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