Effects of additive manufacturing processes on part defects and properties: a classification review von de Pastre, Marc-Antoine, Quinsat, Yann, Lartigue, Claire

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Shape defect analysis from volumetric data - Application to lattice struts in additive manufacturing von de Pastre, Marc-Antoine, Quinsat, Yann, Lartigue, Claire

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Virtual volume correlation of lattice structures: From volumetric data to geometrical and dimensional defects identification von de Pastre, Marc-Antoine, Quinsat, Yann

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Test artefacts for additive manufacturing: A design methodology review von de Pastre, Marc-Antoine, Toguem Tagne, Saint-Clair, Anwer, Nabil

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Polymer powder bed fusion surface texture measurement von de Pastre, Marc-Antoine, Thompson, Adam, Quinsat, Yann, Albajez García, José A, Senin, Nicola, Leach, Richard

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A Fully Integrated Hall Sensor Microsystem for Contactless Current Measurement von Ajbl, Andrea, Pastre, Marc, Kayal, Maher

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System-Level Design Considerations for Carbon Nanotube Electromechanical Resonators von Kayal, Maher, Sallese, Jean-Michel, Pastre, Marc, Kauth, Christian

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Simultaneous High-Speed High-Resolution Nanomechanical Mass Sensing von Kauth, Christian, Pastre, Marc, Kayal, Maher

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57‐1: Invited Paper: AirTouch System: Hand Skeleton Modelling for Augmented HMI Interactions von Bagnato, Luigi, Caron, Louis-Charles, Tao, Dominique, Phan, Véronique, Fine, Kevin, Pastre, Marc, Ballan, Hussein

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Global Modeling Strategy of Parasitic Coupled Currents Induced by Minority-Carrier Propagation in Semiconductor Substrates von Lo Conte, F., Sallese, J.-M., Pastre, M., Krummenacher, F., Kayal, M.

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High-Speed Power System Transient Stability Simulation Using Highly Dedicated Hardware von Nagel, Ira, Fabre, Laurent, Pastre, Marc, Krummenacher, Francois, Cherkaoui, Rachid, Kayal, Maher

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A Hall Sensor Analog Front End for Current Measurement With Continuous Gain Calibration von Pastre, M., Kayal, M., Blanchard, H.

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A Circuit-Level Substrate Current Model for Smart-Power ICs von Lo Conte, Fabrizio, Sallese, Jean-Michel, Pastre, M, Krummenacher, F, Kayal, M

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A Hall sensor microsystem with continuous gain calibration using fully integrated references von Ajbl, Andrea, Pastre, Marc, Kayal, Maher

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A fully integrated Hall sensor microsystem for contactless current measurement von Ajbl, A., Pastre, M., Kayal, M.

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Capacitorless 1T DRAM sensing scheme with automatic reference generation von Blagojevic, M., Kayal, M., Pastre, M., Harik, L., Declercq, M.J., Okhonin, S., Fazan, P.C.

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Capacitorless IT DRAM sensing scheme with automatic reference generation von BLAGOJEVIC, Marija, PASTRE, Marc, HARIK, Louis, DECLERCQ, Michel J, OKHONIN, Serguei, FAZAN, Pierre C

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PAD: A New Interactive Knowledge-Based Analog Design Approach von Stefanovic, Danica, Kayal, Maher, Pastre, Marc

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A navigation-grade MEMS accelerometer based on a versatile front end von Pastre, M., Kayal, M., Schmid, H., Zwahlen, P., Yufeng Dong, Nguyen, A-M

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An internally non-linear ADC for a ΣΔ accelerometer loop von Schmid, H, Sigel, S, Pastre, M, Kayal, M, Zwahlen, P, Nguyen, A.-M

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