A study of the moisture effects on SnO2 thick films by sensitivity and permittivity measurements von MARTINELLI, G, CAROTTA, M. C, PASSARI, L, TRACCHI, L

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Effects of ageing on porous silicon photoluminescence: Correlation with FTIR and UV-Vis spectra von Butturi, M.A., Carotta, M.C., Martinelli, G., Passari, L., Youssef, G.M., Chiorino, A., Ghiotti, G.

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CH4 thick-film gas sensors: Characterization method and theoretical explanation von Carotta, M.C., Dallara, C., Martinelli, G., Passari, L., Camanzi, A.

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Relationship between resistivity and phosphorus concentration in silicon von Mousty, F., Ostoja, P., Passari, L.

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Comparison between normal and reverse thin crystalline silicon solar cells von Benati, A., Butturi, M.A., Capperdoni, C., Carotta, M.C., Martinelli, G., Merli, M., Passari, L., Sartori, G., Van Steenwinkel, R., Youssef, G.M.

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Minority carrier lifetime in furnace and E-beam annealed CZ silicon von SUSI, E, LULLI, G, PASSARI, L

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The effects of oxygen precipitates on the electrical properties of silver impurities in p-type silicon von Adegboyega, G. A., Passari, L., Butturri, M. A., Susi, E.

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Lattice disorder and recombination centres in heat-treated FZ silicon von Negrini, P., Passari, L., Poggi, A., Servidori, M., Susi, E.

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RTA-induced defects: a comparison between lamp and electron beam techniques von Susi, E., Poggi, A., Fabbri, R., Merli, M., Carotta, M.C., Passari, L.

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Determination of minority carrier mobility in silicon from stationary and transient lifetime measurements von Susi, Enrichetta, Passari, L., Merli, M., Carotta, Maria Cristina

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Low frequency internal friction of Al-Al2O3 dispersed-phase alloys (SAP) von Mezzetti, F., Passari, L.

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Magnetization and State of Order in MnNi3 von Paoletti, A., Ricci, F. P., Passari, L.

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Electrical resistivity measurements in quenched aluminium-alumina alloys von Nobili, D., Passari, L.

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A study of the moisture effects on SnO 2 thick films by sensitivity and permittivity measurements von Martinelli, G., Carotta, M.C., Passari, L., Tracchi, L.

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Recombination mechanisms and doping density in silicon von PASSARI, L, SUSI, E

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Comparison of experimental and theoretical carrier concentrations in heavily doped n -type silicon von Finetti, M., Mazzone, A. M., Passari, L., Pietra, S., Susi, E.

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Anomalous increase of resistivity during ageing of aluminium-silver alloys von Federighi, T., Passari, L.

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Automatic resonant-bar apparatus for plotting of internal friction against strain amplitude von Bergamasco, G, Passari, L, Zini, G

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Effect of thickness and surface treatment on silicon water reflectance von Carotta, M.C., Merli, M., Passari, L., Palmeri, D., Martinelli, G., Van Steenwinkel, R.

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CH 4 thick-film gas sensors: Characterization method and theoretical explanation von Carotta, M.C., Dallara, C., Martinelli, G., Passari, L., Camanzi, A.

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