Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach von Alberici, S.G., Zonca, R., Pashmakov, B.

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Electro-optical investigations of Ovonic chalcogenide memory devices von Mytilineou, E., Ovshinsky, S.R., Pashmakov, B., Strand, D., Jablonski, D.

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Total dose radiation response and high temperature imprint characteristics of chalcogenide based RAM resistor elements von Bernacki, S., Hunt, K., Tyson, S., Hudgens, S., Pashmakov, B., Czubatyj, W.

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Reversible changes of the optical and electrical properties of amorphous InOx by photoreduction and oxidation von FRITZSCHE, H, PASHMAKOV, B, CLAFLIN, B

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Photoreduction and oxidation of amorphous indium oxide von Pashmakov, B., Claflin, B., Fritzsche, H.

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Investigation of dissolution kinetics of thin Ge-Sb-S chalcogenide films von Savova, E., Pashmakov, B., Pamukchieva, V.

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Transport near the mobility edge, the sign of the hall effect, photoreduction and oxidation of amorphous InO χ von Pashmakov, B., Claflin, B., Fritzsche, H.

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Comment on “Photodilatation Effect of Undoped a -Si:H Films” von Pashmakov, B., Fritzsche, H.

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Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach von ALBERICI, S. G, ZONCA, R, PASHMAKOV, B

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Room-temperature oxygen diffusion in a-axis normal YBa2Cu3Ox thin films von PASHMAKOV, B, ZHANG, K, JAEGER, H. M, TIWARI, P, WU, X. D

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A study of the adhesion of vacuum-evaporated polyethylene films to aluminium von Bekiarov, D., Pashmakov, B., Vateva, E., Alexieva, C.

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Electrophotographic multi-layer plates based on vacuum-evaporated cadmium sulphide and polyethylene von Pashmakov, B., Vateva, E., Bekirov, A.

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Reversible changes of the optical and electrical properties of amorphous InO x by photoreduction and oxidation von Fritzsche, H., Pashmakov, B., Claflin, B.

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Properties of laser-beam sputtered CdS thin films von PASHMAKOV, B, NESHEVA, D, VATEVA, E, DIMITROV, D, METEV, S

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Room-temperature oxygen diffusion in a-axis normal YBa 2Cu 3O x thin films von Pashmakov, B., Zhang, K., Jaeger, H.M., Tiwari, P., Wu, X.D.

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Direct measurements of room-temperature oxygen diffusion in YBa2Cu3Ox von Mogilevsky, R, Levi-Setti, R, Pashmakov, B, Liu, L, Zhang, K, Jaeger, HM, Buchholz, DB, Chang, RP, Veal, BW

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Transport near the mobility edge, the sign of the Hall effect, photoreduction and oxidation of amorphous InOx von PASHMAKOV, B, CLAFFIN, B, FRITZSCHE, H

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Direct measurements of room-temperature oxygen diffusion in YBa 2 Cu 3 O x von Mogilevsky, R., Levi-Setti, R., Pashmakov, B., Liu, Li, Zhang, K., Jaeger, H. M., Buchholz, D. B., Chang, R. P. H., Veal, B. W.

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