Nanoscale characterization of different stiction mechanisms in electrostatically driven MEMS devices based on adhesion and friction measurements von Zaghloul, U., Bhushan, B., Pons, P., Papaioannou, G.J., Coccetti, F., Plana, R.

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A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy von Zaghloul, U, Papaioannou, G J, Coccetti, F, Pons, P, Plana, R

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Determination of bulk discharge current in the dielectric film of MEMS capacitive switches von Koutsoureli, M.S., Papaioannou, G.J.

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Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs von Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices von Zaghloul, U, Bhushan, B, Pons, P, Papaioannou, G J, Coccetti, F, Plana, R

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Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress von Michalas, L., Papaioannou, G.J., Voutsas, A.T.

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Back gate influence on front channel operation of p-channel double gate polysilicon TFTs von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques von Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.

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The effect of generation–recombination mechanisms on the transient behavior of polycrystalline silicon transistors von Papaioannou, G.J., Voutsas, A., Exarchos, M., Kouvatsos, D.

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Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress von Voutsas, A.T., Kouvatsos, D.N., Michalas, L., Papaioannou, G.J.

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Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy von Zaghloul, U, Papaioannou, G J, Wang, H, Bhushan, B, Coccetti, F, Pons, P, Plana, R

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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance von Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.

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A temperature study of photosensitivity in SLS polycrystalline silicon TFTs von Michalas, L., Syntychaki, A., Koutsoureli, M., Papaioannou, G.J., Voutsas, A.T.

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Performance of thin-film transistors fabricated by sequential lateral solidification crystallization techniques von Exarchos, M. A., Moschou, D. C., Papaioannou, G. J., Kouvatsos, D. N., Voutsas, A. T.

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ESD failure signature in capacitive RF MEMS switches von Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., Plana, R.

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RF MEMS sensitivity to electromagnetic radiation von Theonas, V G, Exarchos, M, Konstantinidis, G, Papaioannou, G J

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The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs von Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

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Charging of radiation induced defects in RF MEMS dielectric films von Exarchos, M., Papandreou, E., Pons, P., Lamhamdi, M., Papaioannou, G.J., Plana, R.

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Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs von Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

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