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  1. 1
    METHOD FOR FLAW DETECTION IN SEMICONDUCTOR INSTRUMENTS AND LARGE SCALE CIRCUITS BASED ON STRUCTURE METAL-DIELECTRIC-SEMICONDUCTOR

    METHOD FOR FLAW DETECTION IN SEMICONDUCTOR INSTRUMENTS AND LARGE SCALE CIRCUITS BASED ON STRUCTURE METAL-DIELECTRIC-SEMICONDUCTOR von PANICHKIN ALEKSANDR V, LADYGIN EVGENIJ A, GORYUNOV NIKOLAJ N, GALEEV ANDREJ P, KRYLOV DMITRIJ G

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  2. 2
    METHOD FOR ESTIMATING QUALITY OF SEED TREATMENT

    METHOD FOR ESTIMATING QUALITY OF SEED TREATMENT von KRYLOV SERGEJ V, ZAKHARIN ALEKSANDR A, TRIFONOVA MARIYA F, PANICHKIN LEONID A, PANOVA IRINA N, KORNEVA EVGENIYA YA

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