Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk von Kilchytska, V., Pailloncy, G., Lederer, D., Raskin, J.-P., Collaert, N., Jurczak, M., Flandre, D.

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Precompensation of Supply Dynamics of Dynamic Power Supply Transmitters Using a Linear Parameter-Varying Model von Bronders, Piet, Lataire, John, Coppens, Thierry, Pailloncy, Guillaume, Gustafsson, Sebastian, Rolain, Yves, Vandersteen, Gerd

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Extending the Best Linear Approximation to Characterize the Nonlinear Distortion in GaN HEMTs von Thorsell, M., Andersson, K., Pailloncy, G., Rolain, Y.

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High-Frequency Noise Performance of 60-nm Gate-Length FinFETs von Raskin, J.-P., Pailloncy, G., Lederer, D., Danneville, F., Dambrine, G., Decoutere, S., Mercha, A., Parvais, B.

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High-Frequency and Noise Performances of 65-nm MOSFET at Liquid Nitrogen Temperature von Siligaris, A., Pailloncy, G., Delcourt, S., Valentin, R., Lepilliet, S., Danneville, F., Gloria, D., Dambrine, G.

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Vector two-tone measurements for validation of non-linear microwave FinFET model von Crupi, Giovanni, Avolio, Gustavo, Schreurs, Dominique M.M.-P., Pailloncy, Guillaume, Caddemi, Alina, Nauwelaers, Bart

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Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs von Pailloncy, G., Raynaud, C., Vanmackelberg, M., Danneville, F., Lepilliet, S., Raskin, J.-P., Dambrine, G.

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Static and High-Frequency Behavior and Performance of Schottky-Barrier p-MOSFET Devices von Pearman, D.J., Pailloncy, G., Raskin, J.-P., Larson, J.M., Snyder, J.P., Parker, E.H.C., Whall, T.E.

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Gaining advanced insight in the phase stability of comb generators using a Large-Signal Network Analyzer von Pailloncy, G., Vanden Bossche, M.

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Measurement and system for performing a calibration von Verbeyst Frans, Pailloncy Guillaume, Vanden Bossche Marc

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Measurement and System for Performing a Calibration von VERBEYST FRANS, VANDEN BOSSCHE MARC, PAILLONCY GUILLAUME

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Large-signal waveform acquisition of pulsed signals von Andersson, Kristoffer, Thorsell, Mattias, Pailloncy, Guillaume, Verbeyst, Frans

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METHOD AND SYSTEM FOR PERFORMING A CALIBRATION von VERBEYST, FRANS, VANDEN BOSSCHE, MARC, PAILLONCY, GUILLAUME

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Next-generation comb generators for accurate modulated measurements von Verbeyst, Frans, Bossche, Marc Vanden, Pailloncy, Guillaume

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Verfahren und System zur Durchführung elner Kalibrierung von VERBEYST, FRANS, VANDEN BOSSCHE, MARC, PAILLONCY, GUILLAUME

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Verfahren zum Kalibrieren eines vektoriellen Netzwerk-Analysators von VERBEYST, FRANS, VANDEN BOSSCHE, MARC, PAILLONCY, GUILLAUME

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Substrate Effect on the Output Conductance Frequency Response of SOI MOSFETs von Kilchytska, Valeria, Levacq, David, Lederer, Dimitri, Pailloncy, Guillaume, Raskin, Jean-Pierre, Flandre, Denis

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Monte Carlo characterization of fabricated partially-depleted SOI MOSFETs: high-frequency performance von Rengel, R., Martin, M.J., Pailloncy, G., Dambrine, G., Danneville, F.

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Large-Signal Network Analysis Including the Baseband von Pailloncy, G, Avolio, G, Myslinski, M, Rolain, Y, Bossche, M V, Schreurs, D

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