Parameterization of the dielectric function of semiconductor nanocrystals von Petrik, P.

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Interannual adjustments in stomatal and leaf morphological traits of European beech (Fagus sylvatica L.) demonstrate its climate change acclimation potential von Petrik, P., Petek‐Petrik, A., Kurjak, D., Mukarram, M., Klein, T., Gömöry, D., Střelcová, K., Frýdl, J., Konôpková, A., Schuldt, B.

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Contrasting strategies in morphological and physiological response to drought stress among temperate forest understory forbs and graminoids von Petek-Petrik, A, Petrík, P, Halmová, M, Plichta, R, Matoušková, M, Houšková, K, Chudomelová, M, Urban, J, Hédl, R

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The combined effect of branch position, temperature, and VPD on gas exchange and water-use efficiency of Norway spruce von PETEK-PETRIK, A., HÚDOKOVÁ, H., FLEISCHER, P., JAMNICKÁ, G., KURJAK, D., SLIACKA KONÔPKOVÁ, A., PETRÍK, P.

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Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces von Gurbán, S., Petrik, P., Serényi, M., Sulyok, A, Menyhárd, M., Baradács, E., Parditka, B., Cserháti, C., Langer, G. A., Erdélyi, Z.

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Spectroscopic characterization of phase transformation in Ge-rich Al2O3 films grown by magnetron co-sputtering von Khomenkova, L., Makasheva, K., Petrik, P., Tsybrii, Z., Melnichuk, O., Melnichuk, L., Balberg, I., Gourbilleau, F., Korsunska, N.

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Ellipsometric models for vertically inhomogeneous composite structures von Petrik, P.

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Approaches to calculate the dielectric function of ZnO around the band gap von Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M., Petrik, P.

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Laser irradiation effects in FeRh thin film von Merkel, D G, Sájerman, K, Váczi, T, Lenk, S, Hegedűs, G, Sajti, S, Németh, A, Gracheva, M A, Petrik, P, Mukherjee, D, Horváth, Z E, Nagy, D L, Lengyel, A

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TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition von Fogarassy, Zs, Petrik, P., Duta, L., Mihailescu, I. N., Anastasescu, M., Gartner, M., Antonova, K., Szekeres, A.

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Refractive index and interband transitions in strain modified NaNbO3 thin films grown by MOCVD von Bin Anooz, S, Petrik, P, Schmidbauer, M, Remmele, T, Schwarzkopf, J

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Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry von Petrik, P., Gumprecht, T., Nutsch, A., Roeder, G., Lemberger, M., Juhasz, G., Polgar, O., Major, C., Kozma, P., Janosov, M., Fodor, B., Agocs, E., Fried, M.

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Optical characterization of patterned thin films von Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U., Hertwig, A.

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Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation von Szekeres, A., Alexandrova, S., Petrik, P., Fodor, B., Bakalova, S.

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Spectroellipsometric characterization of nanocrystalline diamond layers von Lohner, T., Csíkvári, P., Petrik, P., Hárs, G.

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Resolving lateral and vertical structures by ellipsometry using wavelength range scan von Petrik, P., Agocs, E., Volk, J., Lukacs, I., Fodor, B., Kozma, P., Lohner, T., Oh, S., Wakayama, Y., Nagata, T., Fried, M.

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Endoleaks following endovascular repair of abdominal aortic aneurysm: The predictive value of preoperative anatomic factors—a review of 100 cases von Petrik, Pavel V., Moore, Wesley S.

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Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride von Fodor, B., Cayrel, F., Agocs, E., Alquier, D., Fried, M., Petrik, P.

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Study of As―Se―Te glasses by neutron-, X-ray diffraction and optical spectroscopic methods von Fábián, M., Sváb, E., Pamukchieva, V., Szekeres, A., Petrik, P., Vogel, S., Ruett, U.

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Expanded beam (macro-imaging) ellipsometry von Fried, M., Juhász, G., Major, C., Petrik, P., Polgár, O., Horváth, Z., Nutsch, A.

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