Parameterization of the dielectric function of semiconductor nanocrystals von Petrik, P.

Volltext

Optical characterization of patterned thin films von Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U., Hertwig, A.

Volltext

Interannual adjustments in stomatal and leaf morphological traits of European beech (Fagus sylvatica L.) demonstrate its climate change acclimation potential von Petrik, P., Petek‐Petrik, A., Kurjak, D., Mukarram, M., Klein, T., Gömöry, D., Střelcová, K., Frýdl, J., Konôpková, A., Schuldt, B.

Volltext

Spectroellipsometric characterization of nanocrystalline diamond layers von Lohner, T., Csíkvári, P., Petrik, P., Hárs, G.

Volltext

Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry von Petrik, P., Kumar, N., Fried, M., Fodor, B., Juhasz, G., Pereira, S. F., Burger, S., Urbach, H. P.

Volltext

The combined effect of branch position, temperature, and VPD on gas exchange and water-use efficiency of Norway spruce von PETEK-PETRIK, A., HÚDOKOVÁ, H., FLEISCHER, P., JAMNICKÁ, G., KURJAK, D., SLIACKA KONÔPKOVÁ, A., PETRÍK, P.

Volltext

Ellipsometric models for vertically inhomogeneous composite structures von Petrik, P.

Volltext

Segregation of alloying elements to stabilize θ′ phase interfaces in Al-Cu based alloys von Petrik, M.V., Gornostyrev, Yu.N., Korzhavyi, P.A.

Volltext

Spectroscopic characterization of phase transformation in Ge-rich Al2O3 films grown by magnetron co-sputtering von Khomenkova, L., Makasheva, K., Petrik, P., Tsybrii, Z., Melnichuk, O., Melnichuk, L., Balberg, I., Gourbilleau, F., Korsunska, N.

Volltext

ADAPTIVE CAPABILITIES OF MIDDLE SCHOOL-AGED GIRLS DEPENDING ON THE RATIO OF ADIPOSE AND MUSCLE TISSUE von Petrik, Ksenija Y, Kritschfalushii, Oksana P

Volltext

Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces von Gurbán, S., Petrik, P., Serényi, M., Sulyok, A, Menyhárd, M., Baradács, E., Parditka, B., Cserháti, C., Langer, G. A., Erdélyi, Z.

Volltext

Approaches to calculate the dielectric function of ZnO around the band gap von Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M., Petrik, P.

Volltext

Endoleaks following endovascular repair of abdominal aortic aneurysm: The predictive value of preoperative anatomic factors—a review of 100 cases von Petrik, Pavel V., Moore, Wesley S.

Volltext

Laser irradiation effects in FeRh thin film von Merkel, D G, Sájerman, K, Váczi, T, Lenk, S, Hegedűs, G, Sajti, S, Németh, A, Gracheva, M A, Petrik, P, Mukherjee, D, Horváth, Z E, Nagy, D L, Lengyel, A

Volltext

Species groups can be transferred across different scales von Petřík, Petr, Bruelheide, Helge

Volltext

TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition von Fogarassy, Zs, Petrik, P., Duta, L., Mihailescu, I. N., Anastasescu, M., Gartner, M., Antonova, K., Szekeres, A.

Volltext

Refractive index and interband transitions in strain modified NaNbO3 thin films grown by MOCVD von Bin Anooz, S, Petrik, P, Schmidbauer, M, Remmele, T, Schwarzkopf, J

Volltext

Influence of gamma radiation on self-assembled molecular layers developed on different metals von Pfeifer, É.K., Trif, L., Petrik, P., Mink, J., Gyurika, I.G., Telegdi, J.

Volltext

Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation von Szekeres, A., Alexandrova, S., Petrik, P., Fodor, B., Bakalova, S.

Volltext

Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry von Petrik, P., Gumprecht, T., Nutsch, A., Roeder, G., Lemberger, M., Juhasz, G., Polgar, O., Major, C., Kozma, P., Janosov, M., Fodor, B., Agocs, E., Fried, M.

Volltext