Multiple banking relationships and the fragility of corporate borrowers von Foglia, A., Laviola, S., Marullo Reedtz, P.

Volltext

Risposta a Niccoli. (Response to Niccoli) von P. MARULLO REEDTZ

Volltext

Effetti dei massimali di crescita sul sistema bancario e sulla distribuzione del credito. (The effects of “growth limits” on the banking system and on the distribution of credit)... von P. MARULLO REEDTZ

Volltext

The Definition of the Grading Scales in Banks' Internal Rating Systems von Foglia, A., Iannotti, S., Marullo Reedtz, P.

Volltext

Credit risk assessment and relationship lending von Altman, Edward I, Krahnen, Jan, Saunders, Anthony, Angbazo, Lazarus A, Mei, Jianping, Elsas, Ralf, Krahnen, Jan Pieter, Harhoff, Dietmar, Körting, Timm, Machauer, Achim, Weber, Martin, Franks, Julian, Mayer, Colin, Bardos, Mireille, Varetto, Franco, Foglia, A, Laviola, S, Reedtz, P Marullo, del Angel, Gabriela F, Márquez Diez-Canedo, Javier, Patiño Gorbea, Estela

Volltext

Water quality trading with asymmetric information, uncertainty and transaction costs: A stochastic agent-based simulation von Nguyen, N.P., Shortle, J.S., Reed, P.M., Nguyen, T.T.

Volltext

Bank interest rates and credit relationships in Italy von D’Auria, Claudio, Foglia, Antonella, Reedtz, Paolo Marullo

Volltext

The IEN CCC Bridge to Scale the Quantized Hall Resistance to 1- $Omega$ Standards von Boella, G., Mihai, I., Marullo-Reedtz, G., Capra, P.P., Gasparotto, E.

Volltext

The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect von Melcher, J., Schurr, J., Pierz, K., Williams, J.M., Giblin, S.P., Cabiati, F., Callegaro, L., Marullo-Reedtz, G., Cassiago, C., Jeckelmann, B., Jeanneret, B., Overney, F., Bohacek, J., Riha, J., Power, O., Murray, J., Nunes, M., Lobo, M., Godinho, I.

Volltext

The IEN CCC bridge to scale the quantized Hall resistance to 1-/spl Omega/ standards von Boella, G., Mihai, I., Marullo-Reedtz, G., Capra, P.P., Gasparotto, E.

Volltext

Comparison EUROMET.EM-K8 of DC voltage ratio: results von Marullo-Reedtz, G., Cerri, R., Waldmann, W., Streit, J., Immonen, P., Blanc, I., Raso, F., Funck, T., Schumacher, B., Dierikx, E.F., Nunes, M., Vrabcek, P., Rudohradsky, D., Gunnarsson, O., Rydler, K.-E., Jeanneret, B., Jeckelmann, B., Pulfer, T., Turhan, S.S., Yilmaz, O., Williams, J.M., Slinde, H., Lind, K., Nicolas, J., Lindic, M., Flouda, E., Erdos, G.

Volltext

The IEN CCC Bridge to Scale the Quantized Hall Resistance to 1-Ω Standards von Boella, G., Mihai, I., Marullo-Reedtz, G., Capra, P., Gasparotto, E.

Volltext bestellen

Comparison Euromet.EM-K8 of DC Voltage Ratio: Results von Marullo-Reedtz, G., Cerri, R., Waldmann, W., Streit, J., Immonen, P., Blanc, I., Raso, F., Funck, T., Schumacher, B., Dierikx, E., Nunes, M., Vrabcek, P., Rudohradsky, D., Gunnarsson, O., Jeanneret, B., Jeckelmann, B., Pulfer, T., Selcik Turhan, S., Yilmaz, O., Williams, J., Slinde, H., Lind, K., Nicolas, J., Lindic, M., Flouda, I., Erdos, G.

Volltext bestellen