High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors von Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan

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High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors von Adeboye, Stephen Oyeniran, Ubar, Raimund, Jenihhin, Maksim, Gürsoy, Cemil Cem, Raik, Jaan

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Mixed-level identification of fault redundancy in microprocessors von Adeboye, Stephen Oyeniran, Ubar, Raimund, Jenihhin, Maksim, Gursoy, Cemil Cem, Raik, Jaan

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