Application of the Generalized Differential Quadrature Method to the Study of Pull-In Phenomena of MEMS Switches von Sadeghian, H., Rezazadeh, G., Osterberg, P.M.

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M-TEST: A test chip for MEMS material property measurement using electrostatically actuated test structures von Osterberg, P.M., Senturia, S.D.

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Correction To "M-test: A Test Chip For Mems Material Property Measurement Using Electrostatically Actuated Test Structures" von Osterberg, P.M., Senturia, S.D.

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Special singularity integrals encountered in electric circuits [RLC circuit examples] von Inan, A.S., Osterberg, P.M.

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Calculating electromagnetic force and energy using singularity functions von Inan, A.S., Osterberg, P.M.

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Revisiting the sifting integral: an interesting special case von Inan, A.S., Osterberg, P.M.

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"Membuilder": An Automated 3D Solid Model Construction Program For Microelectromechanical Structures von Osterberg, P.M., Senturia, S.D.

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Implementation of MEMCAD system for electrostatic and mechanical analysis of complex structures from mask descriptions von Gilbert, J.R., Osterberg, P.M., Harris, R.M., Ouma, D.O., Cai, X., Pfajfer, A., White, J., Senturia, S.D.

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