An Integral approach to measurement of surface roughness parameters from light scattering in dielectric waveguides von Osovitskii, A. N.

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Effects of surface roughness and absorption on light propagation in graded-profile waveguides von Danilenko, S S, Osovitskii, A N

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Characteristics of a waveguide method for measuring the surface-roughness parameters of smooth dielectrics von Osovitskii, A. N., Tupanov, L. V.

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The waveguide method for measuring parameters of the surface layers von Danilenko, S.S., Osovitskii, A.N.

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Analysis of limit energy characteristics of planar demultiplexers von Bronnikov, A. V., Osovitskii, A. N.

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Emission properties of graded-index corrugated waveguides with a metal or semiconductor coating von Ataya, B A, Osovitskiĭ, A N

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Displacement Sensor with Controlled Measuring Force and its Characteristics Analysis von Wang, Xuan Ze, Yang, Liang En, Zheng, Lin

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Reactive Infiltration: Effects of Different Parameters von López-González, M Karla, Figueroa-Quintero, Leidy, Villalgordo-Hernández, David, Ramos Fernández, Enrique V, Narciso, Javier

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Inferring Ecological Relationships from the Edges of Scatter Diagrams: Comparison of Regression Techniques von Scharf, Frederick S., Juanes, Francis, Sutherland, Michael

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Comparison of photoexcited p -InAs THz radiation sourcewith conventional thermal radiation sources von Smith, M. L., Mendis, R., Vickers, R. E. M., Lewis, R. A.

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Discoveries of nanostructures of natural mercury-bearing gold at the surface of ilmenite crystals from the Fadeevskii ore-and-placer cluster (Primor’ye) von Molchanov, V. P., Khanchuk, A. I., Medvedev, E. I., Plyusnina, L. P.

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Using waveguide scattering of laser radiation for determining the autocorrelation function of statistical surface roughness within a wide range of changes of the roughness correlat... von Egorov, Alexander A

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Optimisation of a grating device for coupling radiation in and out of a thin-film waveguide on a silicon substrate von Parriaux, O, Sychugov, V A, Tikhomirov, A E, Tishchenko, A V, Usievich, B A

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