Growth of SiC Boules with Low Boron Concentration von Everson, W.J., Fanton, Mark A., Snyder, David, Gamble, Rick D., Cavalero, R.L., Ray, R.G, Weiland, B.E., Oslosky, Ed

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Microwave Dielectric Loss Characterization of Silicon Carbide Wafers von Everson, W.J., Furman, Eugene, Lanagan, M., Snyder, David, Perini, Steve, Gamble, Rick D., Bogart, Timothy, Oslosky, Ed

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