Oscilloscopes von Herres, David

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Petahertz optical oscilloscope von Kim, Kyung Taec, Zhang, Chunmei, Shiner, Andrew D., Schmidt, Bruno E., Légaré, François, Villeneuve, D. M., Corkum, P. B.

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oscilloscope

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High-performance oscilloscope von Mandelis, Andreas

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Silicon-chip-based ultrafast optical oscilloscope von Foster, Mark A., Salem, Reza, Geraghty, David F., Turner-Foster, Amy C., Lipson, Michal, Gaeta, Alexander L.

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Oscilloscope omission von Rosenbaum, Stan

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oscilloscope

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Terahertz Oscilloscope for Recording Time Information of Ultrashort Electron Beams von Zhao, Lingrong, Wang, Zhe, Tang, Heng, Wang, Rui, Cheng, Yun, Lu, Chao, Jiang, Tao, Zhu, Pengfei, Hu, Long, Song, Wei, Wang, Huida, Qiu, Jiaqi, Kostin, Roman, Jing, Chunguang, Antipov, Sergey, Wang, Peng, Qi, Jia, Cheng, Ya, Xiang, Dao, Zhang, Jie

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The complete optical oscilloscope von Lei, Cheng, Goda, Keisuke

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High-frequency mixed-signal oscilloscope von Mandelis, Andreas

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Oscilloscopes

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Wide-bandwidth digital oscilloscopes von Mandelis, Andreas

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Three-dimensional (3D) moment imaging with a USB3 oscilloscope von Ranathunga, Yasashri, Olowolafe, Temitayo, Lee, Suk Kyoung, Li, Wen

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Test solutions for oscilloscopes von Mandelis, Andreas

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Real-time ultrafast oscilloscope with a relativistic electron bunch train von Baek, In Hyung, Kim, Hyun Woo, Bark, Hyeon Sang, Jang, Kyu-Ha, Park, Sunjeong, Shin, Junho, Kim, Young Chan, Kim, Mihye, Oang, Key Young, Lee, Kitae, Rotermund, Fabian, Vinokurov, Nikolay A., Jeong, Young Uk

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Digital storage oscilloscopes von Mandelis, Andreas

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Verification of Real-Time Oscilloscope for Millimeter-Wave Modulated-Signal Measurements Using an NVNA Test Bench von Zhang, Yichi, Nian, Fushun, Yuan, Guoping, Yang, Baoguo, Liang, Shengli

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Size and isotope analysis of individual nanoparticles by multi-collector ICP-MS using “event-triggered signal capture” with a high-speed oscilloscope von Xing, Pengju, Belshaw, Nicholas Stanley, Dong, Junhang, Li, Lujie, Geng, Yuanhui, Zheng, Hongtao, Liu, Xing, Zhu, Zhenli

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An optical oscilloscope for the mid-infrared von Shalaby, Mostafa

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Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects von Lee, Kyunghoon, Jeong, Sangyeong, Choi, Wooshin, Choi, Jung-Hwan, Kim, Jingook

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