Surface charge in dielectric barrier discharge plasma actuators von Opaits, D. F., Shneider, M. N., Miles, Richard B., Likhanskii, A. V., Macheret, S. O.

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Electrodynamic effects in nanosecond-pulse-sustained long dielectric-barrier-discharge plasma actuators von Opaits, D. F., Shneider, M. N., Miles, R. B.

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Non-thermal atmospheric pressure plasmas for aeronautic applications von Miles, R. B., Opaits, D. F., Shneider, M. N., Zaidi, S. H., Macheret, S. O.

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Electrodynamic effects in nanosecond-pulse-sustained longdielectric-barrier-discharge plasma actuators von Opaits, D. F., Shneider, M. N., Miles, R. B.

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Surface barrier discharge evolution in air and nitrogen: Role of negative ions von Leonov, S, Miles, R, Opaits, D, Soloviev, V

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Comparison of Experimental Measurements and Theoretical Description for Cathode-Directed Streamer von Pancheshnyi, S, Nudnova, M, Opaits, D, Strikovskii, A

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REFLECTOMETER TO MONITOR SUBSTRATE MOVEMENT von Opaits, Dmitry, Luque, Jorge, Tian, Siyuan, Pape, Eric A, Bonde, Jeffrey D

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Reflectometer to monitor substrate movement von Opaits, Dmitry, Luque, Jorge, Tian, Siyuan, Pape, Eric A, Bonde, Jeffrey D

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Systems and methods for aligning measurement device in substrate processing systems von Opaits, Dmitry, Bailey, III, Andrew D, Musselman, Marcus

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REFLECTOMETER TO MONITOR SUBSTRATE MOVEMENT von Opaits, Dmitry, Luque, Jorge, Tian, Siyuan, Pape, Eric A, Bonde, Jeffrey D

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REFLECTOMETER TO MONITOR SUBSTRATE MOVEMENT von LUQUE, Jorge, TIAN, Siyuan, OPAITS, Dmitry, PAPE, Eric A, BONDE, Jeffrey D

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SYSTEMS AND METHODS FOR ALIGNING MEASUREMENT DEVICE IN SUBSTRATE PROCESSING SYSTEMS von Musselman Marcus, Bailey, III Andrew D, Opaits Dmitry

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Systems and methods for aligning measurement device in substrate processing systems von OPAITS, DMITRY, BAILEY III, ANDREW D, MUSSELMAN, MARCUS

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기판 운동 (movement) 을 모니터링하기 위한 반사계 von LUQUE JORGE, OPAITS DMITRY, BONDE JEFFREY D, PAPE ERIC A, TIAN SIYUAN

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Systems and methods for aligning measurement device in substrate processing systems von OPAITS, DMITRY, BAILEY III, ANDREW D, MUSSELMAN, MARCUS

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SYSTEMS AND METHODS FOR ALIGNING MEASUREMENT DEVICE IN SUBSTRATE PROCESSING SYSTEMS von ANDREW D. BAILEY, III, DMITRY OPAITS, MARCUS MUSSELMAN

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SYSTEMS AND METHODS FOR ALIGNING MEASUREMENT DEVICE IN SUBSTRATE PROCESSING SYSTEMS von MUSSELMAN MARCUS, OPAITS DMITRY, BAILEY III ANDREW D

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