Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA von Van Der Pol, Jacob A., Kuper, Fred G., Ooms, Eric R.

Volltext

Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination von Van der Pol, J.A., Ooms, E.R., Van 't Hof, T., Kuper, F.G.

Volltext bestellen

Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes von Ooms, E.R., Van der Pol, J.A.

Volltext bestellen

Short loop monitoring of metal stepcoverage by simple electrical measurements von van der Pol, J.A., Ooms, E.R., Brugman, H.T.

Volltext bestellen

Meiotic arrest occurs most frequently at metaphase and is often incomplete in azoospermic men von Enguita-Marruedo, Andrea, Sleddens-Linkels, Esther, Ooms, Marja, de Geus, Vera, Wilke, Martina, Blom, Eric, Dohle, Gert R., Looijenga, Leendert H.J., van Cappellen, Wiggert, Baart, Esther B., Baarends, Willy M.

Volltext

Production of Sm-153 With Very High Specific Activity for Targeted Radionuclide Therapy von Van de Voorde, Michiel, Duchemin, Charlotte, Heinke, Reinhard, Lambert, Laura, Chevallay, Eric, Schneider, Thomas, Van Stenis, Miranda, Cocolios, Thomas Elias, Cardinaels, Thomas, Ponsard, Bernard, Ooms, Maarten, Stora, Thierry, Burgoyne, Andrew R.

Volltext

Variable heavy chain gene analysis of follicular lymphomas: correlation between heavy chain isotype expression and somatic mutation load von Aarts, Wilhelmina M., Bende, Richard J., Steenbergen, Eric J., Kluin, Philip M., Ooms, Engelbert C.M., Pals, Steven T., van Noesel, Carel J.M.

Volltext

Production of Sm-153 With Very High Specific Activity for Targeted Radionuclide Thera von Van de Voorde, Michiel, Duchemin, Charlotte, Heinke, Reinhard, Lambert, Laura, Chevallay, Eric, Schneider, Thomas, Van Stenis, Miranda, Cocolios, Thomas Elias, Cardinaels, Thomas, Ponsard, Bernard, Ooms, Maarten, Stora, Thierry, Burgoyne, Andrew R

Volltext

Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs von Kuper, F., van der Pol, J., Ooms, E., Johnson, T., Wijburg, R., Koster, W., Johnston, D.

Volltext bestellen

CONTINUOUS PRODUCTION OF ARYLCARBONATE PURPOSE von BISCHOF ERIC DR, KUEHLING STEFFEN DR, SCHOEN NORBERT DR, DAHMER JUERGEN DR, BUYSCH HANS-JOSEF DR, JAKOB WOLFGANG ING, OOMS PIETER DR, ZABY GOTTFRIED DR

Volltext bestellen

Verfahren zur kontinuierlichen Herstellung von Arylcarbonaten von JAKOB, WOLFGANG., 47447 MOERS, DE, DAHMER, JUERGEN. DR., 51061 KOELN, DE, SCHOEN, NORBERT. DR., 64289 DARMSTADT, DE, OOMS, PIETER. DR., 47800 KREFELD, DE, BISCHOF, ERIC. DR., 42799 LEICHLINGEN, DE, ZABY, GOTTFRIED. DR., 51375 LEVERKUSEN, DE, KUEHLING, STEFFEN. DR., 40670 MEERBUSCH, DE, BUYSCH, HANS-JOSEF. DR., 47809 KREFELD, DE

Volltext bestellen