Advanced 100V, 0.13 gm BCD process for next generation automotive applications von Wessels, P., Swanenberg, M., Claes, J., Ooms, E.R.

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Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination von Van der Pol, J.A., Ooms, E.R., Van 't Hof, T., Kuper, F.G.

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Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA von Van Der Pol, Jacob A., Kuper, Fred G., Ooms, Eric R.

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Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability era von Van der Pol, J.A., Kuper, F.G., Ooms, E.R.

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Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes von Ooms, E.R., Van der Pol, J.A.

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Short loop monitoring of metal stepcoverage by simple electrical measurements von van der Pol, J.A., Ooms, E.R., Brugman, H.T.

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Extended (180 V) voltage in 0.6 /spl mu/m thin-layer-SOI A-BCD3 technology on 1 /spl mu/m BOX for display, automotive and consumer applications von Ludikhuize, A.W., van der Pol, J.A., Heringa, A., Padiy, A., Ooms, E.R., van Kessel, P., Hessels, G.J.J., Swanenberg, M.J., van Velzen, B., van der Vlist, H., Egbers, J.H.H.A., Stoutjesdijk, M.

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Immunological and biological properties of iodoinsulin labeled with one or less atoms of iodine per molecule von Arquilla, E R, Ooms, H, Mercola, K

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Polysulphone inhibits final differentiation steps of osteogenesis in vitro von van Loon, Jack J. W. A., Bierkens, Johan, Maes, Jef, Schoeters, Greet E. R., Ooms, Daniella, Doulabi, Behrouz Zandieh, Veldhuijzen, J. Paul

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