Determination of the stress level for voltage screen of integrated circuits von Kho, R.M., Moonen, A.J., Girault, V.M., Bisschop, J., Olthof, E.H.T., Nath, S., Liang, Z.N.

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Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes von Olthof, E.H.T., de Raad, G.J.

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The rovibrational ν2 Raman spectrum of ammonia: a comparison of theory and experiment von Wormer, P.E.S., Olthof, E.H.T., Engeln, R.A.H., Reuss, J.

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Is (NH 3) 2 hydrogen bonded? von Olthof, E.H.T., van der Avoird, A., Wormer, P.E.S.

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