Effect of ultrasound on reverse leakage current of silicon Schottky barrier structure von Olikh, O. Ya, Voitenko, K. V., Burbelo, R. M., Olikh, Ja M.

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Influence of ultrasound treatment and dynamic (in-situ) ultrasound loading on the temperature hysteresis of electrophysical characteristics in irradiated n-Si–Fz von Babych, V. M.

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Ultrasound influence on the electrical activity of radiation defects in γ-irradiated n-type silicon crystals von V. M. Babych, A. P. Dolgolenko, Ja. M. Olikh, M. D. Tymochko

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Properties and application of ultrasonic Lamb waves in CdcHg1-xTe plates von Lysiuk, I O, Machulin, V F, Olikh, Ja M

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Ultrasonic influence on point defects in a dislocation free Si von Ostrovskii, I.V., Olikh, O.J., Nadtochii, A.B.

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