Spatially resolved refractometry, fluorophore-concentration, axial-position, and orientational imaging using an evanescent Bessel beam von Szederkenyi, Kaitlin, Julien, Carine, Lagarde, Bruno, Olevsko, Ilya, Salomon, Adi, Oheim, Martin

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Colour-coded nanoscale calibration and optical quantification of axial fluorophore position von Olevsko-Arad, Ilya, Feldberg, Moshe, Oheim, Martin, Salomon, Adi

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A colour-encoded nanometric ruler for axial super-resolution microscopies von Olevsko, Ilya, Shavit, Omer, Feldberg, Moshe, Abulafia, Yossi, Salomon, Adi, Oheim, Martin

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A simple, inexpensive and multi‐scale 3‐D fluorescent test sample for optical sectioning microscopies von Olevsko, Ilya, Szederkenyi, Kaitlin, Corridon, Jennifer, Au, Aaron, Delhomme, Brigitte, Bastien, Thierry, Fernandes, Julien, Yip, Christopher, Oheim, Martin, Salomon, Adi

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Characterizing nanometric thin films with far-field light von Klimovsky, Hodaya, Shavit, Omer, Julien, Carine, Olevsko, Ilya, Hamode, Mohamed, Abulafia, Yossi, Suaudeau, Hervé, Armand, Vincent, Oheim, Martin, Salomon, Adi

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Characterization of Nanometric Thin Films with Far‐Field Light von Klimovsky, Hodaya, Shavit, Omer, Julien, Carine, Olevsko, Ilya, Hamode, Mohamed, Abulafia, Yossi, Suaudeau, Hervé, Armand, Vincent, Oheim, Martin, Salomon, Adi

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A Colour-Encoded Nanometric Ruler for Axial Super-Resolution Microscopies von Olevsko, Ilya, Shavit, Omer, Feldberg, Moshe, Abulafia, Yossi, Salomon, Adi, Oheim, Martin

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A Colour-Encoded Nanometric Ruler for Axial Super-Resolution Microscopies von Olevsko, Ilya, Shavit, Omer, Feldberg, Moshe, Abulafia, Yossi, Salomon, Adi, Oheim, Martin

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