Effect of Accumulated Charge on the Total Ionizing Dose Response of a NAND Flash Memory von Kay, Matthew J., Gadlage, Matthew J., Duncan, Adam R., Ingalls, David, Howard, Andrew, Oldham, Timothy R.

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Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure von Oldham, T. R., Dakai Chen, Friendlich, M. R., LaBel, K. A.

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Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory von Oldham, T. R., Friendlich, M. R., Wilcox, E. P., LaBel, K. A., Buchner, S. P., McMorrow, D., Mavis, D. G., Eaton, P. H., Castillo, J.

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Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies von Pellish, Jonathan A, Xapsos, Michael A, Stauffer, Craig A, Jordan, Thomas M, Sanders, Anthony B, Ladbury, Raymond L, Oldham, Timothy R, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P

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Time dependence of switching oxide traps von Lelis, A.J., Oldham, T.R.

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Triplet-state photophysics of aluminium phthalocyanine sensitizer in murine cancer cells von Oldham, Timothy C., Phillips, David

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2001 Nuclear and Space Radiation Effects Conference (NSREC 2001) von Oldham, Timothy R.

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Flash Photolysis of Sensitizers in Microbes von Oldham, Timothy C, Phillips, David

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Attempts to measure sensitiser photophysics in opaque tissue von Oldham, Timothy C., Phillips, David, MacRobert, A.J.

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Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA von Cochran, Donna J, Dakai Chen, Oldham, Timothy R, Sanders, Anthony B, Kim, Hak S, Campola, Michael J, Buchner, Stephen P, LaBel, Kenneth A, Marshall, Cheryl J, Pellish, Jonathan A, Carts, Martin A, O'Bryan, Martha V

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Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA von O'Bryan, Martha V, LaBel, Kenneth A, Pellish, Jonathan A, Dakai Chen, Lauenstein, Jean-Marie, Marshall, Cheryl J, Ladbury, Ray L, Oldham, Timothy R, Kim, Hak S, Phan, Anthony M, Berg, Melanie D, Carts, Martin A, Sanders, Anthony B, Buchner, Stephen P, Marshall, Paul W, Xapsos, Michael A, Irom, Farokh, Pearce, Larry G, Thomson, Eric T, Bernard, Theju M, Satterfield, Harold W, Williams, Alan P, van Vonno, Nick W, Salzman, James F, Burns, Sam, Albarian, Rafi S

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Uniformity and Morphology of 10 x 100mm 4° Off-Axis 4H-SiC Epitaxial Layers and their Effect on Device Performance von Oldham, Timothy, Casady, Janna, Das, Hrishikesh, Sunkari, Swapna, Rodgers, Josh

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What is the best portable method of purifying water to prevent infectious disease? von Oldham, David, Crawford, Paul, Nichols, William, Mott, Timothy

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Electron spin resonance evidence for the structure of a switching oxide trap: Long term structural change at silicon dangling bond sites in SiO2 von Conley, John F., Lenahan, Patrick M., Lelis, Aivars J., Oldham, Timothy R.

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Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory von Oldham, T.R., Friendlich, M., Carts, M.A., Seidleck, C.M., LaBel, K.A.

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Recombination along the tracks of heavy charged particles in SiO2 films von OLDHAM, T. R

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High Uniformity with Reduced Surface Roughness of Chloride Based CVD Process on 100mm 4° Off-Axis 4H-SiC von Casady, Janna R. B., Das, Hrishikesh, Casady, Jeff B., Sunkari, Swapna G., Oldham, Timothy

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Reliability effects of X-ray lithography exposures on submicron-channel MOSFETs von Lelis, A.J., Oldham, T.R.

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Radiation Test Challenges for Scaled Commercial Memories von LaBel, K.A., Ladbury, R.L., Cohn, L.M., Oldham, T.R.

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Cage size affects dissolved oxygen distribution in salmon aquaculture von Oldham, Tina, Oppedal, Frode, Dempster, Timothy David

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