Knockdown of an arbuscular mycorrhiza-inducible phosphate transporter gene of Lotus japonicus suppresses mutualistic symbiosis von Maeda, D.(Kyoto Univ. (Japan)), Ashida, K, Iguchi, K, Chechetka, S.A, Hijikata, A, Okusako, Y, Deguchi, Y, Izui, K, Hata, S

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Transcriptome Profiling of Lotus japonicus Roots During Arbuscular Mycorrhiza Development and Comparison with that of Nodulation von Deguchi, Yuichi, Banba, Mari, Shimoda, Yoshikazu, Chechetka, Svetlana A., Suzuri, Ryota, Okusako, Yasuhiro, Ooki, Yasuhiro, Toyokura, Koichi, Suzuki, Akihiro, Uchiumi, Toshiki, Higashi, Shiro, Abe, Mikiko, Kouchi, Hiroshi, Izui, Katsura, Hata, Shingo

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Stability of densely contact-electrified charges on thin silicon oxide in air von MORITA, S, UCHIHASHI, T, OKUSAKO, T, YAMANISHI, Y, OASA, T, SUGAWARA, Y

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Proximity effects of negative charge groups contact-electrified on thin silicon oxide in air von Uchihashi, Takayuki, Okusako, Takahiro, Sugawara, Yasuhiro, Yamanishi, Yoshiki, Oasa, Takahiko, Morita, Seizo

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Reproducible and controllable contact electrification on a thin insulator von MORITA, S, FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, SUGAWARA, Y, YAMANISHI, Y, OASA, T

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Stable-unstable phase transition of densely contract [contact]-electrified electrons on thin silicon oxide von MORITA, S, SUGAWARA, Y, FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, YAMANISHI, Y, OSAKA, T

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Dissipation of contact electrified electrons on dielectric thin films with silicon substrate von OKUSAKO, T, UCHIHASHI, T, NAKANO, A, IDA, T, SUGAWARA, Y, MORITA, S

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Heat treatment and steaming effects of silicon oxide upon electron dissipation on silicon oxide surface von UCHIHASHI, T, OKUSAKO, T, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S

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Phase transition of contact-electrified negative charges on a thin silicon oxide in air von FUKANO, Y, SUGAWARA, Y, UCHIHASHI, T, OKUSAKO, T, MORITA, S, YAMANISHI, Y, OASA, T

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Time-dependent dielectric breakdown of thin silicon oxide using dense contact electrification von FUKANO, Y, HONTANI, K, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S

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Spatial distribution and its phase transition of densely contact-electrified electrons on a thin silicon oxide von SUGAWARA, Y, MORITA, S, FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, YAMANISHI, Y, OASA, T

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Contact electrification on thin SrTiO3 film by atomic force microscope von UCHIHASHI, T, OKUSAKO, T, YAMADA, J, FUKANO, Y, SUGAWARA, Y, IGARASHI, M, KANEKO, R, MORITA, S

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Contact electrification on thin silicon oxide in vacuum von TSUYUGUCHI, T, UCHIHASHI, T, OKUSAKO, T, SUGAWARA, Y, MORITA, S, YAMANISHI, Y, OASA, T

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Spatial distributions of densely contact-electrified charges on a thin silicon oxide von SUGAWARA, Y, MORITA, S, FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, YAMANISHI, Y, OASA, T

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Time evolution of contact-electrified electron dissipation on silicon oxide surface investigated using noncontact atomic force microscope von FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S

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Parameter dependence of stable state of densely contact-electrified electrons on thin silicon oxide von FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S

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Charge Storage on Thin SrTiO 3 Film by Contact Electrification von Uchihashi, Takayuki, Okusako, Takahiro, Tsuyuguchi, Takeshi, Sugawara, Yasuhiro, Igarashi, Masaru, Kaneko, Reizo, Seizo Morita, Seizo Morita

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Contact Electrification on Thin SrTiO 3 Film by Atomic Force Microscope von Uchihashi, Takayuki, Okusako, Takahiro, Yamada, Junji, Fukano, Yoshinobu, Sugawara, Yasuhiro, Igarashi, Masaru, Kaneko, Reizo, Seizo Morita, Seizo Morita

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