X-ray topography contrast from edge dislocations in ZnGeP2 single crystals von Okunev, A. O., Verozubova, G. A.

Volltext

Study of structural defects in ZnGeP2 crystals by X-ray topography based on the Borrmann effect von Okunev, A. O., Verozubova, G. A., Trukhanov, E. M., Dzjuba, I. V., Galtier, P. R. J., Said Hassani, S. A.

Volltext

X-ray topography contrast from edge dislocations in ZnGeP 2 single crystals von Okunev, A. O., Verozubova, G. A.

Volltext

Photoelasticy method for study of structural imperfection of ZnGeP2 crystals von Lei, Zuotao, Okunev, A.O., Zhu, Chongqiang, Verozubova, G.A., Ma, Tianhui, Yang, Chunhui

Volltext

Two-temperature synthesis of non-linear optical compound CdGeAs2 von Zhu, Chongqiang, Verozubova, G.A., Mironov, Yuri P., Lei, Zuotao, Song, Liangcheng, Ma, Tianhui, Okunev, A.O., Yang, Chunhui

Volltext

Bulk growth of ZnGeP2 crystals and their study by X-ray topography von Verozubova, G.A., Okunev, A.O., Gribenyukov, A.I.

Volltext

Bulk growth of ZnGeP sub(2) crystals and their study by X-ray topography von Verozubova, G A, Okunev, A O, Gribenyukov, A I

Volltext

Growth and defect structure of ZnGeP2 crystals von Verozubova, G.A., Okunev, A.O., Gribenyukov, A.I., Trofimiv, A.Yu, Trukhanov, E.M., Kolesnikov, A.V.

Volltext

Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers von Syväjärvi, Mikael, Iakimov, T., Janzén, Erik, Okunev, A.O., Yakimova, Rositza, Udal'tsov, V.E.

Volltext

Wavelet processing of topographic high dynamic range images von Tkal’, V. A., Okunev, A. O., Petrov, M. N., Danil’chuk, L. N.

Volltext

X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface von Okunev, A. O., Shul’pina, I. L.

Volltext

Two-temperature synthesis of non-linear optical compound CdGeAs^sub 2 von Zhu, Chongqiang, Verozubova, GA, Mironov, Yuri P, Lei, Zuotao, Song, Liangcheng, Ma, Tianhui, Okunev, AO, Yang, Chunhui

Volltext

Growth and defect structure of ZnGeP sub(2) crystals von Verozubova, G A, Okunev, A O, Gribenyukov, AI, Trofimiv, AYu, Trukhanov, E M, Kolesnikov, A V

Volltext

Study of structural defects in ZnGeP 2 crystals by X-ray topography based on the Borrmann effect von Okunev, A. O., Verozubova, G. A., Trukhanov, E. M., Dzjuba, I. V., Galtier, P. R. J., Said Hassani, S. A.

Volltext

Detection of growth striations in single crystals by digital processing of topographic images von Tkal, V. A., Okunev, A. O., Petrov, M. N.

Volltext

Melt nonstoichiometry and defect structure of ZnGeP2 crystals von Verozubova, G. A., Trofimov, A. Yu, Trukhanov, E. M., Kolesnikov, A. V., Okunev, A. O., Ivanov, Yu. F., Galtier, P. R. J., Said Hassani, S. A.

Volltext

Bulk growth of ZnGeP2 crystals and their study by X-ray topography von VEROZUBOVA, G. A, OKUNEV, A. O, GRIBENYUKOV, A. I

Volltext

Melt nonstoichiometry and defect structure of ZnGeP{sub 2} crystals von Verozubova, G. A., Trofimov, A. Yu, Trukhanov, E. M., Kolesnikov, A. V., Okunev, A. O., Ivanov, Yu. F., Galtier, P. R. J., Said Hassani, S. A.

Volltext

Section images of dislocations normal to the surface of a 6H-SiC single crystal von Okunev, A. O., Danil’chuk, L. N., Tkal’, V. A.

Volltext

Growth and defect structure of ZnGeP2 crystals von VEROZUBOVA, G. A, OKUNEV, A. O, GRIBENYUKOV, A. I, TROFIMIV, A. Yu, TRUKHANOV, E. M, KOLESNIKOV, A. V

Volltext