Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation von Oho, Eisaku, Suzuki, Kazuhiko, Yamazaki, Sadao

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Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images von Suzuki, Kazuhiko, Oho, Eisaku

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Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy von Oho, Eisaku, Yamazaki, Sadao, Suzuki, Kazuhiko

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PM-17 Noise removal for SEM images using a convolutional neural network von Suzuki, Kazuhiko, Yamazaki, Sadao, Oho, Eisaku

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Special raster scanning for reduction of charging effects in scanning electron microscopy: SRS for Reduction of Charging Effects von Suzuki, Kazuhiko, Oho, Eisaku

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Highly accurate SNR measurement using the covariance of two SEM images with the identical view von Oho, Eisaku, Suzuki, Kazuhiko

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Reduction in acquisition time of scanning electron microscopy image using complex hysteresis smoothing von Oho, Eisaku

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New generation scanning electron microscopy technology based on the concept of active image processing von Oho, Eisaku, Hoshino, Yoshinobu, Ogashiwa, Takeshi

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Quality Improvement of Environmental Secondary Electron Detector Signal Using Helium Gas in Variable Pressure Scanning Electron Microscopy von Oho, Eisaku, Suzuki, Kazuhiko, Yamazaki, Sadao

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Mechanical scanning of the specimen in the scanning electron microscope von Oho, Eisaku, Miyamoto, Makoto

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Automatic contrast adjustment for detail recognition in SEM images using on-line digital image processing von Oho, Eisaku

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Strategies for optimum use of superposition diffractogram in scanning electron microscopy von Oho, Eisaku, Toyomura, Kenji

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Natural color scanning electron microscopy based on the frequency characteristics of the human visual system von Oho, Eisaku, Watanabe, Masashi

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Digital image processingmethods for improvement of quality of high-resolution secondary electron images von OHO, Eisaku, SASAKI, Toshihide, KANAYA, Koichi

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CHARGED PARTICLE BEAM APPARATUS von KAWAMATA SHIGERU, HOSHINO YOSHINOBU, OHO EISAKU

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Proper acquisition and handling of scanning electron microscopy images using a high-performance personal computer von Oho, Eisaku, Ichise, Norihiko, Ogashiwa, Takeshi

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Practical method for noise removal in scanning electron microscopy von Oho, Eisaku, Ichise, Norihiko, Martin, William H., Peters, Klaus-Ruediger

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IMAGE PROCESSING APPARATUS von KURODA, KATSUHIRO, OHO, EISAKU

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Image processing apparatus von KURODA, KATSUHIRO, OHO, EISAKU

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An improvement in digital homomorphic filtering and its practical applications to SEM images von Oho, Eisaku, Sasaki, Toshihide, Ogihara, Akinori, Kanaya, Koichi

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