Broadband method for precise microwave spectroscopy of superconducting thin films near the critical temperature von Kitano, Haruhisa, Ohashi, Takeyoshi, Maeda, Atsutaka

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Photoresist Shrinkage Caused by Single-Line Scan of Electron Beam von Ohashi, Takeyoshi, Tanaka, Junichi

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Precise Cross-Sectional Measurement of Photoresist Shrinkage Caused by Electron Beam Irradiation von Ohashi, Takeyoshi, Sekiguchi, Tomoko, Yamaguchi, Atsuko, Tanaka, Junichi, Kawada, Hiroki

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Crossover from vortex-to-fluctuation picture in the vast vortex-liquid state of cuprate superconductors La2−Sr CuO4 probed by microwave complex conductivity measurement technique von Maeda, Atsutaka, Tanaka, Ryo, Ohashi, Takeyoshi, Imai, Yoshinori, Kitano, Haruhisa, Tsukada, Ichiro

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Microwave electrical resistivity of moderately high Tc superconductor, Y2C3 von Akutagawa, Satoshi, Ohashi, Takeyoshi, Kitano, Haruhisa, Maeda, Atsutaka, Akimitsu, Jun

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Photoresist Shrinkage Caused by Single-Line Scan of Electron Beam von Ohashi, Takeyoshi, Tanaka, Junichi

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Effect of thermal expansion in microwave conductivity measurement von Ohashi, Takeyoshi, Kitano, Haruhisa, Maeda, Atsutaka, Inoue, Ryotaro

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Electron beam metrology for advanced technology nodes von Lorusso, Gian Francesco, Horiguchi, Naoto, Bömmels, Jürgen, Wilson, Christopher J., bosch, Geert Van den, Kar, Gouri Sankar, Ohashi, Takeyoshi, Sutani, Takumichi, Watanabe, Ryota, Takemasa, Yoshikata, Ikota, Masami

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Dynamic fluctuations in the superconductivity of NbN films from microwave conductivity measurements von Ohashi, Takeyoshi, Kitano, Haruhisa, Maeda, Astutaka, Akaike, Hiroyuki, Fujimaki, Akira

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Crossover from vortex-to-fluctuation picture in the vast vortex-liquid state of cuprate superconductors La2−xSrxCuO4 probed by microwave complex conductivity measurement technique... von Maeda, Atsutaka, Tanaka, Ryo, Ohashi, Takeyoshi, Imai, Yoshinori, Kitano, Haruhisa, Tsukada, Ichiro

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Carrier concentration dependence of critical fluctuation in La2-xSrxCuO4 von OHASHI, Takeyoshi, KITANO, Haruhisa, MAEDA, Atsutaka, TSUKADA, Ichiro

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Carrier concentration dependence of critical fluctuation in La2−Sr CuO4 von Ohashi, Takeyoshi, Kitano, Haruhisa, Maeda, Atsutaka, Tsukada, Ichiro

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Charged Particle Beam Apparatus von OHASHI, Takeyoshi, KADOWAKI, Tetsuro, YAMAMOTO, Takuma

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Carrier concentration dependence of critical fluctuation in La 2− x Sr x CuO 4 von Ohashi, Takeyoshi, Kitano, Haruhisa, Maeda, Atsutaka, Tsukada, Ichiro

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Charged Particle Beam System von OHASHI, Takeyoshi, TANIMOTO, Kenji, ABE, Yusuke, NAKAMURA, Yusuke

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Charged particle beam system von Nakamura, Yusuke, Tanimoto, Kenji, Ohashi, Takeyoshi, Abe, Yusuke

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INSPECTION SYSTEM, IMAGE PROCESSING DEVICE AND INSPECTION METHOD von OHASHI, Takeyoshi, IKOTA, Masami

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Electron microscope and method of adjusting focus of electron microscope von Kim, Hyejin, Tanimoto, Kenji, Ohashi, Takeyoshi, Abe, Yusuke

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Frequency-dependent microwave conductivity of La2−xSrxCuO4 thin films von Kitano, Haruhisa, Ohashi, Takeyoshi, Ryuzaki, Hibiki, Maeda, Atsutaka, Tsukada, Ichiro

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Charged Particle Beam System von OHASHI, Takeyoshi, TANIMOTO, Kenji, ABE, Yusuke, NAKAMURA, Yusuke

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