Impact of Double-Suction Pump Eye Diameter Variation on Cavitation Phenomena von Oh, Kyungseok, Kim, Junho

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Experimental and numerical investigation on the dent resistance of a dual phase steel originated from the yield-point phenomenon von Kim, Jaehyun, Lee, Hongwoo, Oh, Kyungseok, Seok, Dong-Yoon, Park, Sungsoo, Kang, Yeonsik, Kim, Do-Nyun

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A 31 ns Random Cycle VCAT-Based 4F ^ DRAM With Manufacturability and Enhanced Cell Efficiency von Song, Ki-Whan, Kim, Jin-Young, Yoon, Jae-Man, Kim, Sua, Kim, Huijung, Chung, Hyun-Woo, Kim, Hyungi, Kim, Kanguk, Park, Hwan-Wook, Kang, Hyun Chul, Tak, Nam-Kyun, Park, Dukha, Kim, Woo-Seop, Lee, Yeong-Taek, Oh, Yong Chul, Jin, Gyo-Young, Yoo, Jeihwan, Park, Donggun, Oh, Kyungseok, Kim, Changhyun, Jun, Young-Hyun

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WaveVC: Speech and Fundamental Frequency Consistent Raw Audio Voice Conversion von Ko, Kyungdeuk, Kim, Donghyeon, Oh, Kyungseok, Ko, Hanseok

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A 1.2V 30nm 1.6Gb/s/pin 4Gb LPDDR3 SDRAM with input skew calibration and enhanced control scheme von Yong-Cheol Bae, Joon-Young Park, Sang Jae Rhee, Seung Bum Ko, Yonggwon Jeong, Kwang-Sook Noh, Younghoon Son, Jaeyoun Youn, Yonggyu Chu, Hyunyoon Cho, Mijo Kim, Daesik Yim, Hyo-Chang Kim, Sang-Hoon Jung, Hye-In Choi, Sungmin Yim, Jung-Bae Lee, Joo Sun Choi, Kyungseok Oh

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A novel method to analyze and design a NWL scheme DRAM von Seokhan Park, Bonggu Sung, Hyuckchai Jung, Junhee Lim, Sangwoon Lee, Jooyoung Lee, Wonsuk Yang, Kyungseok Oh, Taeyoung Chung, Kinam Kim

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Twin silicon nanowire FET (TSNWFET) On SOI with 8 nm silicon nanowires and 25 nm surrounding TiN gate von Dong-Won Kim, Ming Li, Kyoung Hwan Yeo, Yun Young Yeoh, Sung Dae Suk, Keun Hwi Cho, Kyungseok Oh, Won-Seong Lee

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Evaluation of Ultra Thin Body Si-On-ONO (UTB SOONO) transistors using ultra thin spacer technology von Hyun Jun Bae, Sung Hwan Kim, Sung In Hong, Yong Lack Choi, Ho Ju Song, Chang Woo Oh, Dong-Won Kim, Donggun Park, KyungSeok Oh, Won-Seong Lee

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55 nm capacitor-less 1T DRAM cell transistor with non-overlap structure von Ki-Whan Song, Hoon Jeong, Jae-Wook Lee, Sung In Hong, Nam-Kyun Tak, Young-Tae Kim, Yong Lack Choi, Han Sung Joo, Sung Hwan Kim, Ho Ju Song, Yong Chul Oh, Woo-Seop Kim, Yeong-Taek Lee, Kyungseok Oh, Changhyun Kim

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SLEB: Streamlining LLMs through Redundancy Verification and Elimination of Transformer Blocks von Song, Jiwon, Oh, Kyungseok, Kim, Taesu, Kim, Hyungjun, Kim, Yulhwa, Kim, Jae-Joon

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A 31 ns Random Cycle VCAT-Based 4F 2 DRAM With Manufacturability and Enhanced Cell Efficiency von Song, Ki-Whan, Kim, Jin-Young, Yoon, Jae-Man, Kim, Sua, Kim, Huijung, Chung, Hyun-Woo, Kim, Hyungi, Kim, Kanguk, Park, Hwan-Wook, Kang, Hyun Chul, Tak, Nam-Kyun, Park, Dukha, Kim, Woo-Seop, Lee, Yeong-Taek, Oh, Yong Chul, Jin, Gyo-Young, Yoo, Jeihwan, Park, Donggun, Oh, Kyungseok, Kim, Changhyun, Jun, Young-Hyun

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Novel stress-memorization-technology (SMT) for high electron mobility enhancement of gate last high-k/metal gate devices von Kwan-Yong Lim, Hyunjung Lee, Choongryul Ryu, Kang-Ill Seo, Uihui Kwon, Seokhoon Kim, Jongwan Choi, Kyungseok Oh, Hee-Kyung Jeon, Chulgi Song, Tae-Ouk Kwon, Jinyeong Cho, Seunghun Lee, Yangsoo Sohn, Hong Sik Yoon, Junghyun Park, Kwanheum Lee, Wookje Kim, Eunha Lee, Sang-Pil Sim, Chung Geun Koh, Sang Bom Kang, Siyoung Choi, Chilhee Chung

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SLEB: Streamlining LLMs through Redundancy Verification and Elimination of Transformer Blocks von Song, Jiwon, Oh, Kyungseok, Kim, Taesu, Kim, Hyungjun, Kim, Yulhwa, Jae-Joon, Kim

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Misalignment Study by Etch Induced Silicon Damage in Single Crystal Etch Process for Shallow Trench Isolation Structure von Lee, Jung-Chan, Lee, Seung-Jae, Kim, Mun-Jun, Lee, Seung-Heon Lee, Oh, Kyungseok, Lee, Jun-Hee, Kang, Man-Sug, Nam, Seok-Woo, Roh, Yonghan

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Random Telegraph Noise in n-type and p-type silicon nanowire transistors von Seungwon Yang, Kyoung Hwan Yeo, Dong-Won Kim, Kang-ill Seo, Donggun Park, Gyoyoung Jin, KyungSeok Oh, Hyungcheol Shin

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A SERVER AND MTHOD FOR PROVIDING A PRODUCT SERVICE BASED ON A LOCATION OF A USER TERMINAL von KYUNGSEOK OH

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A SELLER TERMINAL AND MTHOD FOR PROVIDING A PRODUCT SERVICE BASED ON A LOCATION OF A USER TERMINAL von KYUNGSEOK OH

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A USER TERMINAL AND MTHOD FOR PROVIDING A PRODUCT SERVICE BASED ON A LOCATION OF THE USER TERMINAL von KYUNGSEOK OH

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HPLC Separation and Characterization of Oligo(2,5-dioctoxy-p-phenylene vinylene) von Oh, Kyungseok, Ryu, Chang Yeol

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Flicker noise in N-type and P-type silicon nanowire transistors von Seungwon Yang, Younghwan Son, Sung Dae Suk, Dong-Won Kim, Donggun Park, Kyungseok Oh, Hyungcheol Shin

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