Génération de seconde harmonique pour la caractérisation des champs électriques d'interface dans les empilements diélectriques-semiconducteurs von Obeid, Baydaa

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(Digital Presentation) Characterization of Passivation Dielectrics on Silicon Through Second Harmonic Generation: Effect of Fixed Charge von Obeid, Baydaa, Bastard, Lionel, Aubriet, Valentin, Courouble, Kristell, Dutartre, Didier, Ionica, Irina

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Polycrystalline inclusion-free growth of thick, lattice-matched SiGeC with high substitutional Carbon concentrations up to 2 von Frauenrath, Marvin, Vives, Jeremy, Devaux, Matteo, Blondel, Claudel, Aybeke, Ece, Obeid, Baydaa, Duru, Romain, Levert, Theo, Printemps, Tony, Verdier, Stephane, Deprat, Fabien

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Evidence of new 2D material: Cu2Te von Tong, Yongfeng, Bouaziz, Meryem, Zhang, Wei, Obeid, Baydaa, Loncle, Antoine, Oughaddou, Hamid, Enriquez, Hanna, Chaouchi, Karine, Esaulov, Vladimir, Chen, Zhesheng, Xiong, Heqi, Cheng, Yingchun, Bendounan, Azzedine

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Evidence of new 2D material: Cu 2 Te von Tong, Yongfeng, Bouaziz, Meryem, Zhang, Wei, Obeid, Baydaa, Loncle, Antoine, Oughaddou, Hamid, Enriquez, Hanna, Chaouchi, Karine, Esaulov, Vladimir, Chen, Zhesheng, Xiong, Heqi, Cheng, Yingchun, Bendounan, Azzedine

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(Digital Presentation) Characterization of Passivation Dielectrics on Silicon Through Second Harmonic Generation: Effect of Fixed Charge von Obeid, Baydaa, Bastard, Lionel, Aubriet, Valentin, Courouble, Kristell, Dutartre, Didier, Ionica, Irina

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(Invited) Second Harmonic Generation: Non-Linear Optics for Characterization of Electrical Properties of Dielectric-on-Semiconductor Interfaces von Ionica, Irina, Damianos, Dimitrios, Obeid, Baydaa, Kaminski, Anne, Blanc-Pélissier, Danièle, Vitrant, Guy, Ghibaudo, Gérard, Cristoloveanu, Sorin, Bouchard, Aude, Mescot, Xavier, Gri, Martine, Lei, Ming, Bastard, Lionel

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