Bounds on multipartite entangled orthogonal state discrimination using local operations and classical communication von Hayashi, M, Markham, D, Murao, M, Owari, M, Virmani, S

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Quantum memory for entangled continuous-variable states von Polzik, E. S, Jensen, K, Wasilewski, W, Krauter, H, Fernholz, T, Nielsen, B. M, Owari, M, Plenio, M. B, Serafini, A, Wolf, M. M

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Squeezing the limit: quantum benchmarks for the teleportation and storage of squeezed states von Owari, M, Plenio, M B, Polzik, E S, Serafini, A, Wolf, M M

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Study on the fundamental predominance in shave-off depth profiling von Fujii, M., Owari, M.

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Study on Anisotropy of Axial Resolutions of Two-Dimensional Shave-Off Method von Shirakura, D., Tomiyasu, B., Owari, M.

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The effect of shave-off scanning at a fabricated section by focused ion beam von Morita, Y., Kuroda, A., Iwata, T., Owari, M.

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Atomic structure analysis of carbonaceous material by laser-assisted 3DAP von Morita, M., Hanaoka, Y., Mayama, N., Suzuki, K., Owari, M.

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Highly accurate shave-off depth profiling by simulation method von Fujii, M., Nakamura, K., Ishizaki, Y., Nojima, M., Owari, M., Nihei, Y.

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Stress of needle specimen on the three-dimensional atom probe (3DAP) von Mayama, N., Yamashita, C., Kaito, T., Nojima, M., Owari, M.

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Local Hypothesis Testing Between a Pure Bipartite State and the White Noise State von Owari, Masaki, Hayashi, Masahito

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Introduction of ice protective film for 3D microscale analysis of biological sample von Iwanami, T., Kinoshita, K., Nojima, M., Owari, M.

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Failure analysis of fine Cu patterning by shave-off profiling von Nojima, M., Fujii, M., Kakuhara, Y., Tsuchiya, H., Kameyama, A., Yokogawa, S., Owari, M., Nihei, Y.

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Shave-off vector profiling for TEM samples von Nojima, M., Fujii, M., Ishizaki, Y., Owari, M., Nihei, Y.

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Development of preset-type sample stage in three-dimensional atom probe von Ito, S., Kaneko, T., Yamashita, C., Kaito, T., Adachi, T., Iwata, T., Mayama, N., Nojima, M., Taniguchi, M., Owari, M.

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Growth of Fe on Ge(1 1 1) at room temperature studied by X-ray photoelectron diffraction von Chu, W.G., Tsuruta, A., Owari, M., Nihei, Y.

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TOF-SIMS measurement for the complex particulate matter in urban air environment von Tomiyasu, B., Suzuki, K., Gotoh, T., Owari, M., Nihei, Y.

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Evaluation of the instrument for three-dimensional atom probe (3DAP) von Kaneko, T., Ito, S., Yamashita, C., Mayama, N., Iwata, T., Nojima, M., Taniguchi, M., Owari, M.

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TOF-SIMS measurements of the exhaust particles emitted from gasoline and diesel engine vehicles von Tomiyasu, B., Owari, M., Nihei, Y.

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Holographic imaging of TiO2 (110) surface structure by differential photoelectron holography von Suzuki, A., Hashimoto, A., Nojima, M., Owari, M., Nihei, Y.

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Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometry von Ishizaki, Y., Yamamoto, T., Fujii, M., Owari, M., Nojima, M., Nihei, Y.

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