Method for Managing the Stress Due to the Strained Nitride Capping Layer in MOS Transistors von Orain, Stphane, Fiori, Vincent, Villanueva, Davy, Dray, Alexandre, Ortolland, Claude

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Layout Scaling of \hbox\hbox \hbox pFETs von Eneman, G., Yamaguchi, S., Ortolland, C., Takeoka, S., Kobayashi, M., Witters, L., Hikavyy, A., Mitard, J., Loo, R., Hoffmann, T.

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Stress Memorization Technique-Fundamental Understanding and Low-Cost Integration for Advanced CMOS Technology Using a Nonselective Process von Ortolland, C., Okuno, Y., Verheyen, P., Kerner, C., Stapelmann, C., Aoulaiche, M., Horiguchi, N., Hoffmann, T.

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Nonuniform Mobility-Enhancement Techniques and Their Impact on Device Performance von Payet, Fabrice, Boeuf, Frederic, Ortolland, Claude, Skotnicki, Thomas

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Layout Scaling of Si1―xGex-Channel pFETs von ENEMAN, Geert, YAMAGUCHI, Shinpei, ORTOLLAND, Claude, TAKEOKA, Shinji, KOBAYASHI, Masaharu, WITTERS, Liesbeth, HIKAVYY, Andriy, MITARD, Jérôme, LOO, Roger, HOFFMANN, Thomas

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Layout Scaling of hbox Si 1 - x hbox Ge x hbox - Channel pFETs von Eneman, Geert, Yamaguchi, Shinpei, Ortolland, Claude, Takeoka, Shinji, Kobayashi, Masaharu, Witters, Liesbeth, Hikavyy, Andriy, Mitard, Jerome, Loo, Roger, Hoffmann, Thomas

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Layout Scaling of [Formula Omitted] pFETs von Eneman, Geert, Yamaguchi, Shinpei, Ortolland, Claude, Takeoka, Shinji, Kobayashi, Masaharu, Witters, Liesbeth, Hikavyy, Andriy, Mitard, Jérôme, Loo, Roger, Hoffmann, Thomas

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Mechanisms of stress generation within a polysilicon gate for nMOSFET performance enhancement von Morin, Pierre, Ortolland, Claude, Mastromatteo, Eric, Chaton, Catherine, Arnaud, Franck

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Interface/Bulk Trap Recovery After Submelt Laser Anneal and the Impact to NBTI Reliability von Moonju Cho, Aoulaiche, Marc, Degraeve, Robin, Ortolland, Claude, Kauerauf, Thomas, Kaczer, Ben, Roussel, Philippe, Hoffmann, Thomas Y, Groeseneken, Guido

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Titanium Silicide/Titanium Nitride Full Metal Gates for Dual-Channel Gate-First CMOS von Frank, Martin M., Cabral, Cyril, Dechene, Jessica M., Ortolland, Claude, Yu Zhu, Marshall, Eric D., Murray, Conal E., Chudzik, Michael P.

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Study of submelt laser induced junction nonuniformities using Therma-Probe von Rosseel, Erik, Bogdanowicz, Janusz, Clarysse, Trudo, Vandervorst, Wilfried, Ortolland, Claude, Hoffmann, Thomas, Salnik, Alex, Nicolaides, Lena, Han, Sang-Hyun, Petersen, Dirch H., Lin, Rong, Hansen, Ole

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Overview of anneal technology for advanced logic CMOS von Ortolland, C.

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Si 1-x Ge x -Channel PFETs: Scalability, Layout Considerations and Compatibility with Other Stress Techniques von Eneman, Geert, Hellings, Geert, Mitard, Jerome, Witters, Liesbeth, Yamaguchi, Shinpei, Garcia Bardon, Marie, Christie, Phillip, Ortolland, Claude, Hikavyy, Andriy, Favia, Paola, Bargallo Gonzalez, Mireia, Simoen, Eddy, Crupi, Felice, Kobayashi, Masaharu, Franco, Jacopo, Takeoka, Shinji, Krom, Raymond, Bender, Hugo, Loo, Roger, Claeys, Cor, De Meyer, Kristin, Hoffmann, Thomas

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Field-effect transistors with a non-relaxed strained channel von Nummy Karen A, Ortolland Claude

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FIELD-EFFECT TRANSISTORS WITH A NON-RELAXED STRAINED CHANNEL von Nummy Karen A, Ortolland Claude

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Virtual bulk in semiconductor on insulator technology von Jain, Vibhor, Pekarik, John J, Liu, Qizhi, Ho, Herbert, Ortolland, Claude

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Heterojunction bipolar transistor with marker layer von Jain, Vibhor, Ontalus, Viorel, Pekarik, John J, Liu, Qizhi, Ho, Herbert, Ortolland, Claude, Holt, Judson R

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Heterojunction bipolar transistor von Jain, Vibhor, Pekarik, John J, Liu, Qizhi, Ho, Herbert, Ortolland, Claude, Holt, Judson R

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Performance Enhancement of PFET Planar Devices by Plasma Immersion Ion Implantation (P3I) von Ortolland, Claude, Horiguchi, Naoto, Kerner, Christoph, Chiarella, Thomas, Eyben, Pierre, Everaert, Jean-Luc, del Agua Borniquel, Jose Ignacio, Poon, Tze, Santhanam, Kartik, Porshnev, Peter, Foad, Majeed, Schreutelkamp, Robert, Absil, Philippe, Vandervorst, Wilfried, Felch, Susan, Hoffmann, Thomas

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Coulomb-blockade in nanometric Si-film silicon-on-nothing (SON) MOSFETs von Monfray, S., Souifi, A., Boeuf, F., Ortolland, C., Poncet, A., Militaru, L., Chanemougame, D., Skotnicki, T.

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