Scanning electron microscope observations of As+-ion-implanted region von TAKAHASHI, Y, YABUUCHI, Y, INAZATO, S, OGURA, K, ONO, A

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Quantitative analysis of electron microscope images recorded on thin polymer films von Kanaya, Koichi, Kawakatsu, Hisazo, Atoda, Nobufumi, Yotsumoto, Haruo, Ono, Akishige

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Illumination Effects and Image Contrasts Due to Various Electron Detectors in SEM von Akishige, Ono, Masateru, Shibata

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Evaporation of Aluminum for Preparing Aluminum Oxide Supporting Film von ONO, Akishige, HASHIMOTO, Hatsujiro, KUMAO, Akihiro

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APPARATUS UTILIZING CHARGED-PARTICLE BEAM von AKISHIGE ONO

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Apparatus utilizing charged-particle beam von ONO, AKISHIGE

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CHARGED PARTICLE BEAM ANALYSER von AKISHIGE ONO

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Scanning electron microscope observations of As super(+)-ion-implanted region von Takahashi, Yasuhito, Yabuuchi, Yasufumi, Inazato, Sachiko, Ogura, Kazumichi, Ono, Akishige

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各種SEMにおける電子の検出法と像の見え方の違い von 小野, 昭成, 柴田, 昌照

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On a Low-Angle Scattering Electron Diffraction von ONO, Akishige, IBE, Katsuhiko, YOTSUMOTO, Haruo

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Visualization of Single Atoms in Molecules and Crystals by Dark Field Electron Microscopy von HASHIMOTO, Hastsujiro, KUMAO, Akihiro, HINO, Kinnosuke, ENDOH, Hisamitsu, YOTSUMOTO, Haruo, ONO, Akishige

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低ノイズ試料支持膜: アルミナ膜,グラファイト膜 von 橋本, 初次郎, 熊尾, 章宏, 小野, 昭成

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Intelligent RF power module using automatic bias control (ABC) system for PCS CDMA applications von Sato, T., Yuyama, S., Nakajima, A., Ono, H., Iwai, A., Hase, E., Kusano, C.

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